http://rdf.ncbi.nlm.nih.gov/pubchem/reference/4006528

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contentType Journal Article
endingPage 433
issn 2050-5701
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issueIdentifier 6
pageRange 423-433
publicationName Microscopy (Oxford, England)
startingPage 423
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bibliographicCitation Zheng H, Cao F, Zhao L, Jiang R, Zhao P, Zhang Y, Wei Y, Meng S, Li K, Jia S, Li L, Wang J. Atomistic and dynamic structural characterizations in low-dimensional materials: recent applications of in situ transmission electron microscopy. Microscopy (Oxf). 2019 Dec 03;68(6):423–33. doi: 10.1093/jmicro/dfz038. PMID: 31746339.
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date 2019-11-18^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://pubmed.ncbi.nlm.nih.gov/31746339
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http://rdf.ncbi.nlm.nih.gov/pubchem/journal/41052
language English
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title Atomistic and dynamic structural characterizations in low-dimensional materials: recent applications of in situ transmission electron microscopy

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