bibliographicCitation |
Knepp TN, Szykman JJ, Long R, Duvall RM, Krug J, Beaver M, Cavender K, Kronmiller K, Wheeler M, Delgado R, Hoff R, Berkoff T, Olson E, Clark R, Wolfe D, Van Gilst D, Neil D. Assessment of mixed-layer height estimation from single-wavelength ceilometer profiles. Atmos. Meas. Tech. 2017 Oct 25;10(10):3963–83. doi: 10.5194/amt-10-3963-2017. |