http://rdf.ncbi.nlm.nih.gov/pubchem/reference/8121754

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Predicate Object
contentType Journal Article
endingPage 1023
issn 1600-5775
issueIdentifier Pt 5
pageRange 1017-1023
publicationName Journal of Synchrotron Radiation
startingPage 1017
bibliographicCitation Unuigbe DM, Harting M, Jonah EO, Britton DT, Nordlund D. Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. J Synchrotron Radiat. 2017 Sep 01;24(Pt 5):1017–23. doi: 10.1107/s1600577517009857. PMID: 28862625.
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date 2017-08-21^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://pubmed.ncbi.nlm.nih.gov/28862625
https://doi.org/10.1107/s1600577517009857
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http://rdf.ncbi.nlm.nih.gov/pubchem/journal/22439
language English
source https://pubmed.ncbi.nlm.nih.gov/
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title Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy
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