bibliographicCitation |
Unuigbe DM, Harting M, Jonah EO, Britton DT, Nordlund D. Investigation of nanoparticulate silicon as printed layers using scanning electron microscopy, transmission electron microscopy, X-ray absorption spectroscopy and X-ray photoelectron spectroscopy. J Synchrotron Radiat. 2017 Sep 01;24(Pt 5):1017–23. doi: 10.1107/s1600577517009857. PMID: 28862625. |