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ORCIDRathish Jayabharathi
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2010 – 2019
- 2016
[j2]Ahish Mysore Somashekar, Spyros Tragoudas, Rathish Jayabharathi, Sreenivas Gangadhar:
Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection. ACM Trans. Design Autom. Electr. Syst. 22(1): 17:1-17:21 (2016)- 2015
- [c11]Ahish Mysore Somashekar, Spyros Tragoudas, Rathish Jayabharathi:
Non-enumerative correlation-aware path selection. ICCD 2015: 629-634 - 2013
- [c10]Unni Chandran, Dan Zhao, Rathish Jayabharathi:
Hybrid 3D pre-bonding test framework design. ETS 2013: 1 - 2012
- [c9]Ahish Mysore Somashekar, Spyros Tragoudas, Sreenivas Gangadhar, Rathish Jayabharathi:
Non-enumerative generation of statistical path delays for ATPG. ICCD 2012: 514-515
2000 – 2009
- 2006
- [j1]Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi:
Exact Delay Fault Coverage in Sequential Logic Under Any Delay Fault Model. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(12): 2954-2964 (2006) - [c8]Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi:
Exact At-speed Delay Fault Grading in Sequential Circuits. ITC 2006: 1-10 - 2005
- [c7]Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, Rathish Jayabharathi:
Implicit and Exact Path Delay Fault Grading in Sequential Circuits. DATE 2005: 990-995 - 2001
- [c6]Kee Sup Kim, Rathish Jayabharathi, Craig Carstens:
SpeedGrade: An RTL Path Delay Fault Simulator. Asian Test Symposium 2001: 239-243 - [c5]Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine:
DPDAT: data path direct access testing. ITC 2001: 188-195
1990 – 1999
- 1999
- [c4]Rathish Jayabharathi, Manuel A. d'Abreu, Jacob A. Abraham:
FzCRITIC - A Functional Timing Verifier Using a Novel Fuzzy Delay Model. VLSI Design 1999: 232-235 - 1997
- [c3]Rathish Jayabharathi, Kyung Tek Lee, Jacob A. Abraham:
A Novel Solution for Chip-Level Functional Timing Verification. VTS 1997: 137-142 - 1996
- [c2]Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham:
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. VTS 1996: 354-361 - 1993
- [c1]Rathish Jayabharathi, Thomas Thomas, Earl E. Swartzlander Jr.:
A Comparative Evaluation of Adders Based on Performance and Testability. ICCD 1993: 314-317
Coauthor Index
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