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ORCIDAbhijit Chatterjee
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- affiliation: Georgia Institute of Technology, Atlanta, USA
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2020 – today
- 2024
[j105]Chandramouli N. Amarnath
, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee:
Error Resilience in Deep Neural Networks Using Neuron Gradient Statistics. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(4): 1149-1162 (2024)- [c327]Anurup Saha, Chandramouli N. Amarnath, Kwondo Ma, Abhijit Chatterjee:
Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery. ASPDAC 2024: 740-745 - [c326]Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee:
Learning Assisted Post-Manufacture Testing and Tuning of RRAM-Based DNNs for Yield Recovery. DATE 2024: 1-6 - [c325]Suhasini Komarraju, Mohamed Mejri, Akhil Tammana, Gowsika Dharmaraj, Chandramouli N. Amarnath, Abhijit Chatterjee:
AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate. ETS 2024: 1-4 - [c324]Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee:
Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery. ETS 2024: 1-4 - [c323]Anurup Saha, Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee:
Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks. IOLTS 2024: 1-7 - [c322]Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee:
DeepER-HD: An Error Resilient HyperDimensional Computing Framework with DNN Front-End for Feature Selection. LATS 2024: 1-6 - [c321]Kwondo Ma, Anurup Saha, Suhasini Komarraju, Chandramouli N. Amarnath, Abhijit Chatterjee:
Testing and Tuning of RRAM-Based DNNs: A Machine Learning-Assisted Approach. MWSCAS 2024: 688-692 - [c320]Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee:
ADARE-HD: Adaptive-Resolution Framework for Efficient Object Detection and Tracking via HD-Computing. MWSCAS 2024: 811-817 - [c319]Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee:
Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering. VTS 2024: 1-7 - [i8]Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee:
A Novel Hyperdimensional Computing Framework for Online Time Series Forecasting on the Edge. CoRR abs/2402.01999 (2024) - [i7]Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee:
LARS-VSA: A Vector Symbolic Architecture For Learning with Abstract Rules. CoRR abs/2405.14436 (2024) - 2023
- [j104]Akash Kumar Ball, Swati Rana, Gargi Agrahari, Abhijit Chatterjee:
Accelerated calculation of configurational free energy using a combination of reverse Monte Carlo and neural network models: Adsorption isotherm for 2D square and triangular lattices. Comput. Phys. Commun. 285: 108654 (2023) - [j103]Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
BISCC: A Novel Approach to Built In State Consistency Checking For Quick Volume Validation of Mixed-Signal/RF Systems. J. Electron. Test. 39(3): 303-322 (2023) - [c318]Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee:
Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression. ETS 2023: 1-6 - [c317]Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee:
A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks. ETS 2023: 1-4 - [c316]Chandramouli N. Amarnath, Abhijit Chatterjee:
A Novel Approach to Error Resilience in Online Reinforcement Learning. IOLTS 2023: 1-7 - [c315]Kwondo Ma, Chandramouli N. Amarnath, Abhijit Chatterjee, Jacob A. Abraham:
Secure Control Loop Execution of Cyber-Physical Devices Using Predictive State Space Checks. ISQED 2023: 1-8 - [c314]Suhasini Komarraju, Akhil Tammana, Chandramouli N. Amarnath, Abhijit Chatterjee:
OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems. ITC 2023: 37-46 - [c313]Chandramouli N. Amarnath, Abhijit Chatterjee:
Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron Checks. LATS 2023: 1-2 - 2022
- [j102]Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee:
Gaussian Control Barrier Functions: Non-Parametric Paradigm to Safety. IEEE Access 10: 99823-99836 (2022) - [j101]Saurabh Shivpuje, Abhijit Chatterjee:
TPMD toolkit: A toolkit for studying rate processes using molecular dynamics trajectories and performing temperature programmed molecular dynamics calculations. Comput. Phys. Commun. 270: 108177 (2022) - [j100]Abhijit Chatterjee, Ratnasingham Tharmarasa:
Effects of Measurement Uncertainties on Multitarget Tracking. IEEE Instrum. Meas. Mag. 25(1): 37-45 (2022) - [j99]Abhijit Chatterjee, Ratnasingham Tharmarasa:
Reward Factor-Based Multiple Agile Satellites Scheduling With Energy and Memory Constraints. IEEE Trans. Aerosp. Electron. Syst. 58(4): 3090-3103 (2022) - [c312]Abhijit Chatterjee:
Development of Smart Sensor for IoT Based Environmental Data Analysis Through Edge Computing. COMS2 2022: 1-10 - [c311]Suhasini Komarraju, Abhijit Chatterjee:
Self-Aware MIMO Beamforming Systems: Dynamic Adaptation to Channel Conditions and Manufacturing Variability. DATE 2022: 572-575 - [c310]Chandramouli N. Amarnath, Mohamed Mejri, Kwondo Ma, Abhijit Chatterjee:
Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics. IOLTS 2022: 1-7 - [c309]Jun-Yang Lei, Abhijit Chatterjee:
ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug of AMS Circuits. ITC 2022: 268-277 - [c308]Kwondo Ma, Anurup Saha, Chandramouli N. Amarnath, Abhijit Chatterjee:
Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks. ITC 2022: 499-503 - [c307]Suhasini Komarraju, Abhijit Chatterjee:
Reinforcement Learning Based Power-Optimal Usage of Beamforming Antenna Array for Multi-Way Wireless Communication in Vehicular Traffic Environments. MWSCAS 2022: 1-4 - [c306]Kwondo Ma, Mohamed Mejri, Chandramouli N. Amarnath, Abhijit Chatterjee:
Low Power Neural Network Accelerators Using Collaborative Weight Tuning and Shared Shift-Add optimization. MWSCAS 2022: 1-4 - [i6]Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee:
Gaussian Control Barrier Functions : A Non-Parametric Paradigm to Safety. CoRR abs/2203.15474 (2022) - 2021
- [j98]Joy Arulraj, Abhijit Chatterjee, Alexandros Daglis, Ashutosh Dhekne, Umakishore Ramachandran:
eCloud: A Vision for the Evolution of the Edge-Cloud Continuum. Computer 54(5): 24-33 (2021) - [j97]Saurabh Shivpuje, Manish Kumawat, Abhijit Chatterjee:
An algorithm for estimating kinetic parameters of atomistic rare events using finite-time temperature programmed molecular dynamics trajectories. Comput. Phys. Commun. 262: 107828 (2021) - [j96]Sabyasachi Deyati, Barry J. Muldrey, Adit D. Singh, Abhijit Chatterjee:
High Resolution Pulse Propagation Driven Trojan Detection in Digital Systems. J. Electron. Test. 37(1): 41-63 (2021) - [j95]Suvadeep Banerjee, Balavinayagam Samynathan, Jacob A. Abraham, Abhijit Chatterjee:
Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding. IEEE Trans. Dependable Secur. Comput. 18(2): 576-592 (2021) - [c305]Jun-Yang Lei, Abhijit Chatterjee:
Automatic Surrogate Model Generation and Debugging of Analog/Mixed-Signal Designs Via Collaborative Stimulus Generation and Machine Learning. ASP-DAC 2021: 140-145 - [c304]Mouhyemen Khan, Tatsuya Ibuki, Abhijit Chatterjee:
Safety Uncertainty in Control Barrier Functions using Gaussian Processes. ICRA 2021: 6003-6009 - [c303]Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee:
Addressing Soft Error and Security Threats in DNNs Using Learning Driven Algorithmic Checks. IOLTS 2021: 1-4 - [c302]Suvadeep Banerjee, Abhijit Chatterjee:
Online Fast Detection and Diagnosis of Power Grid Security Attacks Using State Checksums. IOLTS 2021: 1-7 - [c301]Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee:
Hierarchical Failure Modeling and Machine Learning Assisted Correction of Electro-Mechanical Subsystem Failures in Autonomous Vehicles. ITC 2021: 389-398 - [c300]Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee:
Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. VTS 2021: 1-7 - [i5]Chandramouli N. Amarnath, Aishwarya H. Balwani, Kwondo Ma, Abhijit Chatterjee:
TESDA: Transform Enabled Statistical Detection of Attacks in Deep Neural Networks. CoRR abs/2110.08447 (2021) - 2020
- [j94]Md Imran Momtaz, Abhijit Chatterjee:
Diagnosis and Compensation of Control Program, Sensor and Actuator Failures in Nonlinear Systems Using Hierarchical State Space Checks. J. Electron. Test. 36(6): 683-701 (2020) - [j93]Sabyasachi Deyati, Barry J. Muldrey, Abhijit Chatterjee:
Dynamic Test Stimulus Adaptation for Analog/RF Circuits Using Booleanized Models Extracted From Hardware. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(10): 2006-2019 (2020) - [c299]Mouhyemen Khan, Munzir Zafar, Abhijit Chatterjee:
Barrier Functions in Cascaded Controller: Safe Quadrotor Control. ACC 2020: 1737-1742 - [c298]Mouhyemen Khan, Abhijit Chatterjee:
Gaussian Control Barrier Functions: Safe Learning and Control. CDC 2020: 3316-3322 - [c297]Prantik Chatterjee, Abhijit Chatterjee, José Campos, Rui Abreu, Subhajit Roy:
Diagnosing Software Faults Using Multiverse Analysis. IJCAI 2020: 1629-1635 - [c296]Chandramouli N. Amarnath, Md Imran Momtaz, Abhijit Chatterjee:
Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation. IOLTS 2020: 1-6 - [c295]Mouhyemen Khan, Akash Patel, Abhijit Chatterjee:
Multi-Sparse Gaussian Process: Learning based Semi-Parametric Control. IROS 2020: 5327-5334 - [c294]Suhasini Komarraju, Abhijit Chatterjee:
Fast EVM Tuning of MIMO Wireless Systems Using Collaborative Parallel Testing and Implicit Reward Driven Learning. ITC 2020: 1-10 - [c293]Md Imran Momtaz, Chandramouli N. Amarnath, Abhijit Chatterjee:
Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks. ITC 2020: 1-10 - [c292]Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee:
SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts. ITC 2020: 1-10 - [i4]Mouhyemen Khan, Abhijit Chatterjee:
Online Parameter Estimation for Safety-Critical Systems with Gaussian Processes. CoRR abs/2002.07870 (2020) - [i3]Mouhyemen Khan, Akash Patel, Abhijit Chatterjee:
Multi-Sparse Gaussian Process: Learning based Semi-Parametric Control. CoRR abs/2003.01802 (2020)
2010 – 2019
- 2019
- [j92]Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition. J. Electron. Test. 35(6): 809-822 (2019) - [j91]Suvadeep Banerjee, Abhijit Chatterjee:
ALERA: Accelerated Reinforcement Learning Driven Adaptation to Electro-Mechanical Degradation in Nonlinear Control Systems Using Encoded State Space Error Signatures. ACM Trans. Intell. Syst. Technol. 10(4): 44:1-44:25 (2019) - [c291]Md Imran Momtaz, Abhijit Chatterjee:
Hierarchical State Space Checks for Errors in Sensors, Actuators and Control of Nonlinear Systems: Diagnosis and Compensation. ATS 2019: 141-146 - [c290]Ratnasingham Tharmarasa, Abhijit Chatterjee, Yinghui Wang, Thia Kirubarajan, Jean Berger, Mihai Cristian Florea:
Closed-Loop Multi-Satellite Scheduling Based on Hierarchical MDP. FUSION 2019: 1-7 - [c289]Md Imran Momtaz, Abhijit Chatterjee:
Hierarchical Check Based Detection and Diagnosis of Sensor-Actuator Malfunction in Autonomous Systems: A Quadcopter Study. IOLTS 2019: 316-321 - [c288]Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee:
Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology. ITC 2019: 1-10 - [c287]Barry John Muldrey, Suvadeep Banerjee, Abhijit Chatterjee:
Mixed Signal Design Validation Using Reinforcement Learning Guided Stimulus Generation for Behavior Discovery. VTS 2019: 1-6 - [i2]Mouhyemen Khan, Munzir Zafar, Abhijit Chatterjee:
Barrier Functions in Cascaded Controller: Safe Quadrotor Control. CoRR abs/1903.09711 (2019) - 2018
- [j90]Joshua W. Wells, Abhijit Chatterjee:
Content-Aware Low-Complexity Object Detection for Tracking Using Adaptive Compressed Sensing. IEEE J. Emerg. Sel. Topics Circuits Syst. 8(3): 578-590 (2018) - [c286]Jun-Yang Lei, Thomas Moon, Justin Chow, Suresh K. Sitaraman, Abhijit Chatterjee:
A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect. ATS 2018: 191-196 - [c285]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi:
Device aging: A reliability and security concern. ETS 2018: 1-10 - [c284]Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee:
ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. ETS 2018: 1-2 - [c283]Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee:
Error Resilient Neuromorphic Networks Using Checker Neurons. IOLTS 2018: 135-138 - [c282]Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee:
Cross-Layer Control Adaptation for Autonomous System Resilience. IOLTS 2018: 261-264 - [c281]Wendong Wang, Adit D. Singh, Ujjwal Guin, Abhijit Chatterjee:
Exploiting power supply ramp rate for calibrating cell strength in SRAM PUFs. LATS 2018: 1-6 - 2017
- [j89]Debashis Banerjee, Barry John Muldrey, Xian Wang, Shreyas Sen, Abhijit Chatterjee:
Self-Learning RF Receiver Systems: Process Aware Real-Time Adaptation to Channel Conditions for Low Power Operation. IEEE Trans. Circuits Syst. I Regul. Pap. 64-I(1): 195-207 (2017) - [j88]Joshua W. Wells, Abhijit Chatterjee:
Error-Resilient Video Encoding Using Parallel Independent Signature Processing. IEEE Trans. Circuits Syst. Video Technol. 27(5): 1077-1090 (2017) - [c280]Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
BISCC: Efficient pre through post silicon validation of mixed-signal/RF systems using built in state consistency checking. DATE 2017: 274-277 - [c279]Suvadeep Banerjee, Abhijit Chatterjee:
Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. ETS 2017: 1-6 - [c278]Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee:
Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. IOLTS 2017: 192-195 - [c277]Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
Probabilistic error detection and correction in switched capacitor circuits using checksum codes. IOLTS 2017: 271-276 - [c276]Sabyasachi Deyati, Barry J. Muldrey, Byunghoo Jung, Abhijit Chatterjee:
Concurrent built in test and tuning of beamforming MIMO systems using learning assisted performance optimization. ITC 2017: 1-10 - [c275]Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee:
Post-Silicon Validation: Automatic Characterization of RF Device Nonidealities via Iterative Learning Experiments on Hardware. VLSID 2017: 403-408 - [c274]Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers. VTS 2017: 1-6 - 2016
- [j87]Nicholas Tzou, Debesh Bhatta, Xian Wang, Te-Hui Chen, Sen-Wen Hsiao, Barry J. Muldrey, Hyun Woo Choi, Abhijit Chatterjee:
Concurrent Multi-Channel Crosstalk Jitter Characterization Using Coprime Period Channel Stimulus. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(6): 859-870 (2016) - [j86]Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee:
Digitally Assisted Built-In Tuning Using Hamming Distance Proportional Signatures in RF Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24(9): 2918-2931 (2016) - [c273]Sujay Pandey, Sabyasachi Deyati, Adit D. Singh, Abhijit Chatterjee:
Noise-Resilient SRAM Physically Unclonable Function Design for Security. ATS 2016: 55-60 - [c272]Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee:
Concurrent Stimulus and Defect Magnitude Optimization for Detection of Weakest Shorts and Opens in Analog Circuits. ATS 2016: 96-101 - [c271]Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee:
Concurrent error detection and tolerance in Kalman filters using encoded state and statistical covariance checks. IOLTS 2016: 161-166 - [c270]Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
Trojan detection in digital systems using current sensing of pulse propagation in logic gates. ISQED 2016: 350-355 - [c269]Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. ITC 2016: 1-10 - [c268]Barry John Muldrey, Sabyasachi Deyati, Abhijit Chatterjee:
DE-LOC: Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems. ITC 2016: 1-10 - [c267]Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Checksum based error detection in linearized representations of non linear control systems. LATS 2016: 182 - [c266]Jacob A. Abraham, Abhijit Chatterjee:
Design of Self Calibrating and Error Resilient Mixed-Signal Systems for Signal Processing, Communications and Control. VLSID 2016: 1-2 - [c265]Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
TRAP: Test Generation Driven Classification of Analog/RF ICs Using Adaptive Probabilistic Clustering Algorithm. VLSID 2016: 463-468 - [c264]Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
Adaptive testing of analog/RF circuits using hardware extracted FSM models. VTS 2016: 1-6 - [c263]Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
Real-time DC motor error detection and control compensation using linear checksums. VTS 2016: 1-6 - 2015
- [j85]Vishwanath Natarajan, Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Yield Recovery of RF Transceiver Systems Using Iterative Tuning-Driven Power-Conscious Performance Optimization. IEEE Des. Test 32(1): 61-69 (2015) - [j84]Nicholas Tzou, Debesh Bhatta, Barry J. Muldrey, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee:
Low Cost Sparse Multiband Signal Characterization Using Asynchronous Multi-Rate Sampling: Algorithms and Hardware. J. Electron. Test. 31(1): 85-98 (2015) - [j83]Debashis Banerjee, Shyam Kumar Devarakond, Xian Wang, Shreyas Sen, Abhijit Chatterjee:
Real-Time Use-Aware Adaptive RF Transceiver Systems for Energy Efficiency Under BER Constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(8): 1209-1222 (2015) - [j82]Thomas Moon, Hyun Woo Choi, Nicholas Tzou, Abhijit Chatterjee:
Wideband Sparse Signal Acquisition With Dual-rate Time-Interleaved Undersampling Hardware and Multicoset Signal Reconstruction Algorithms. IEEE Trans. Signal Process. 63(24): 6486-6497 (2015) - [j81]Aritra Banerjee, Abhijit Chatterjee:
Signature Driven Hierarchical Post-Manufacture Tuning of RF Systems for Performance and Power. IEEE Trans. Very Large Scale Integr. Syst. 23(2): 342-355 (2015) - [j80]Debesh Bhatta, Nicholas Tzou, Joshua W. Wells, Sen-Wen Hsiao, Abhijit Chatterjee:
Incoherent Undersampling-Based Waveform Reconstruction Using a Time-Domain Zero-Crossing Metric. IEEE Trans. Very Large Scale Integr. Syst. 23(11): 2357-2370 (2015) - [j79]Aritra Banerjee, Abhijit Chatterjee:
Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation. IEEE Trans. Very Large Scale Integr. Syst. 23(12): 3114-3118 (2015) - [c262]Sabyasachi Deyati, Barry John Muldrey, Adit D. Singh, Abhijit Chatterjee:
Challenge Engineering and Design of Analog Push Pull Amplifier Based Physically Unclonable Function for Hardware Security. ATS 2015: 127-132 - [c261]David C. Keezer, Te-Hui Chen, Thomas Moon, D. T. Stonecypher, Abhijit Chatterjee, Hyun Woo Choi, Sungyeol Kim, Hosun Yoo:
An FPGA-based ATE extension module for low-cost multi-GHz memory test. ETS 2015: 1-6 - [c260]Debashis Banerjee, Shreyas Sen, Abhijit Chatterjee:
Self Learning Analog/Mixed-Signal/RF Systems: Dynamic Adaptation to Workload and Environmental Uncertainties. ICCAD 2015: 59-64 - [c259]Suvadeep Banerjee, Md Imran Momtaz, Abhijit Chatterjee:
Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction. IOLTS 2015: 53-58 - [c258]Mehdi Baradaran Tahoori, Abhijit Chatterjee, Krishnendu Chakrabarty, Abhishek Koneru, Arunkumar Vijayan, Debashis Banerjee:
Self-awareness and self-learning for resiliency in real-time systems. IOLTS 2015: 128-131 - [c257]Xian Wang, Kenfack Blanchard, Estella Silva, Abhijit Chatterjee:
"Safe" built-in test and tuning of boost converters using feedback loop perturbations. LATS 2015: 1-6 - [c256]Jacob A. Abraham, Abhijit Chatterjee:
Tutorial T3: Error Resilient Real-Time Embedded Systems: Computing, Communications and Control. VLSID 2015: 6-7 - [c255]Debesh Bhatta, Suvadeep Banerjee, Abhijit Chatterjee:
A Noise Aware CML Latch Modelling for Large System Simulation. VLSID 2015: 286-291 - [c254]Xian Wang, Debashis Banerjee, Abhijit Chatterjee:
Low cost high frequency signal synthesis: Application to RF channel interference testing. VTS 2015: 1-6 - 2014
- [j78]Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee:
Low Cost Signal Reconstruction Based Testing of RF Components using Incoherent Undersampling. J. Electron. Test. 30(2): 213-228 (2014) - [j77]Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee:
Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters. J. Electron. Test. 30(5): 515-526 (2014) - [j76]Shreyas Sen, Vishwanath Natarajan, Shyam Kumar Devarakond, Abhijit Chatterjee:
Process-Variation Tolerant Channel-Adaptive Virtually Zero-Margin Low-Power Wireless Receiver Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 1764-1777 (2014) - [j75]Hyun Woo Choi, Thomas Moon, Abhijit Chatterjee:
Timing Noise Characterization of High-Speed Digital Bit Sequences Using Incoherent Subsampling and Algorithmic Clock Recovery. IEEE Trans. Instrum. Meas. 63(12): 2733-2749 (2014) - [c253]Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee, Jacob A. Abraham:
Error Resilient Real-Time State Variable Systems for Signal Processing and Control. ATS 2014: 39-44 - [c252]Sabyasachi Deyati, Barry John Muldrey, Adit D. Singh, Abhijit Chatterjee:
High Resolution Pulse Propagation Driven Trojan Detection in Digital Logic: Optimization Algorithms and Infrastructure. ATS 2014: 200-205 - [c251]Suvadeep Banerjee, Álvaro Gómez-Pau, Abhijit Chatterjee:
Design of low cost fault tolerant analog circuits using real-time learned error compensation. ETS 2014: 1-2 - [c250]Debashis Banerjee, Barry John Muldrey, Shreyas Sen, Xian Wang, Abhijit Chatterjee:
Self-learning MIMO-RF receiver systems: process resilient real-time adaptation to channel conditions for low power operation. ICCAD 2014: 710-717 - [c249]Álvaro Gómez-Pau, Suvadeep Banerjee, Abhijit Chatterjee:
Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums. IOLTS 2014: 25-30 - [c248]Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee:
3D-ICs with self-healing capability for thermal effects in RF circuits. ISQED 2014: 179-183 - [c247]Nicholas Tzou, Debesh Bhatta, Abhijit Chatterjee:
Low cost back end signal processing driven bandwidth interleaved signal acquisition using free running undersampling clocks and mixing signals. ITC 2014: 1-10 - [c246]Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee:
A self-tuning architecture for buck converters based on alternative test. ITC 2014: 1-10 - [c245]Jayaram Natarajan, Sahil Kapoor, Debesh Bhatta, Abhijit Chatterjee, Adit D. Singh:
Timing Variation Adaptive Pipeline Design: Using Probabilistic Activity Completion Sensing with Backup Error Resilience. VLSID 2014: 122-127 - [c244]Sabyasachi Deyati, Barry John Muldrey, Aritra Banerjee, Abhijit Chatterjee:
Atomic model learning: A machine learning paradigm for post silicon debug of RF/analog circuits. VTS 2014: 1-6 - [c243]Sen-Wen Hsiao, Chung-Chun Chen, Randy Caplan, Jeff Galloway, Blake Gray, Abhijit Chatterjee:
Phase-locked loop design with SPO detection and charge pump trimming for reference spur suppression. VTS 2014: 1-6 - [c242]Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. VTS 2014: 1-6 - [c241]Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee:
Alternative "safe" test of hysteretic power converters. VTS 2014: 1-6 - 2013
- [j74]Sehun Kook, Aritra Banerjee, Abhijit Chatterjee:
Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs. IEEE Des. Test 30(4): 36-48 (2013) - [j73]Tafizur Rehman, M. Jaipal, Abhijit Chatterjee:
A cluster expansion model for predicting activation barrier of atomic processes. J. Comput. Phys. 243: 244-259 (2013) - [j72]Sehun Kook, Hyun Woo Choi, Abhijit Chatterjee:
Low-Resolution DAC-Driven Linearity Testing of Higher Resolution ADCs Using Polynomial Fitting Measurements. IEEE Trans. Very Large Scale Integr. Syst. 21(3): 454-464 (2013) - [c240]Sen-Wen Hsiao, Xian Wang, Abhijit Chatterjee:
Analog Sensor Based Testing of Phase-Locked Loop Dynamic Performance Parameters. Asian Test Symposium 2013: 50-55 - [c239]Xian Wang, Blanchard Kenfack, Estella Silva, Abhijit Chatterjee:
Built-In Test of Switched-Mode Power Converters: Avoiding DUT Damage Using Alternative Safe Measurements. Asian Test Symposium 2013: 56-61 - [c238]Suvadeep Banerjee, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Enhanced Resolution Time-Domain Reflectometry for High Speed Channels: Characterizing Spatial Discontinuities with Non-ideal Stimulus. Asian Test Symposium 2013: 277-282 - [c237]Debesh Bhatta, Nicholas Tzou, Sen-Wen Hsiao, Abhijit Chatterjee:
Time Domain Reconstruction of Incoherently Undersampled Periodic Waveforms Using Bandwidth Interleaving. Asian Test Symposium 2013: 283-288 - [c236]Debashis Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints. DAC 2013: 56:1-56:7 - [c235]Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Abhijit Chatterjee:
Periodic jitter and bounded uncorrelated jitter decomposition using incoherent undersampling. DATE 2013: 1667-1672 - [c234]Shyam Kumar Devarakond, Debashis Banerjee, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee:
Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters. ETS 2013: 1-6 - [c233]Suvadeep Banerjee, Aritra Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Real-time checking of linear control systems using analog checksums. IOLTS 2013: 122-127 - [c232]Aritra Banerjee, Abhijit Chatterjee:
An adaptive class-E power amplifier with improvement in efficiency, reliability and process variation tolerance. ISCAS 2013: 745-748 - [c231]Debesh Bhatta, Aritra Banerjee, Sabyasachi Deyati, Nicholas Tzou, Abhijit Chatterjee:
Low cost signal reconstruction based testing of RF components using incoherent undersampling. LATW 2013: 1-5 - [c230]Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee:
Predicting die-level process variations from wafer test data for analog devices: A feasibility study. LATW 2013: 1-6 - [c229]Debashis Banerjee, Aritra Banerjee, Shyam Kumar Devarakond, Abhijit Chatterjee:
Adaptive MIMO RF systems: Post-manufacture and real-time tuning for performance maximization and power minimization. MWSCAS 2013: 1095-1099 - [c228]Janusz Rajski, Miodrag Potkonjak, Adit D. Singh, Abhijit Chatterjee, Zain Navabi, Matthew R. Guthaus, Sezer Gören:
Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors. VLSI-SoC 2013 - [c227]Ravi Tej Uppu, Ravi Kanth Uppu, Adit D. Singh, Abhijit Chatterjee:
A High Throughput Multiplier Design Exploiting Input Based Statistical Distribution in Completion Delays. VLSI Design 2013: 109-114 - [c226]Debashis Banerjee, Aritra Banerjee, Abhijit Chatterjee:
Adaptive RF Front-end Design via Self-discovery: Using Real-time Data to Optimize Adaptation Control. VLSI Design 2013: 197-202 - [c225]Sabyasachi Deyati, Aritra Banerjee, Barry John Muldrey, Abhijit Chatterjee:
VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests. VLSI Design 2013: 314-319 - [c224]Sen-Wen Hsiao, Nicholas Tzou, Abhijit Chatterjee:
A programmable BIST design for PLL static phase offset estimation and clock duty cycle detection. VTS 2013: 1-6 - [c223]Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee:
Low-cost multi-channel testing of periodic signals using monobit receivers and incoherent subsampling. VTS 2013: 1-6 - [c222]Barry John Muldrey, Sabyasachi Deyati, Michael Giardino, Abhijit Chatterjee:
RAVAGE: Post-silicon validation of mixed signal systems using genetic stimulus evolution and model tuning. VTS 2013: 1-6 - 2012
- [j71]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures. IEEE Des. Test Comput. 29(1): 48-58 (2012) - [j70]Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Shyam Kumar Devarakond, Hyun Woo Choi, Abhijit Chatterjee:
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting. J. Electron. Test. 28(4): 405-419 (2012) - [j69]Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya:
Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1088-1101 (2012) - [j68]Shreyas Sen, Debashis Banerjee, Marian Verhelst, Abhijit Chatterjee:
A Power-Scalable Channel-Adaptive Wireless Receiver Based on Built-In Orthogonally Tunable LNA. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(5): 946-957 (2012) - [j67]Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers. IEEE Trans. Very Large Scale Integr. Syst. 20(9): 1602-1614 (2012) - [j66]Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler:
A New Self-Healing Methodology for RF Amplifier Circuits Based on Oscillation Principles. IEEE Trans. Very Large Scale Integr. Syst. 20(10): 1835-1848 (2012) - [c221]Debesh Bhatta, Nicholas Tzou, Hyun Woo Choi, Abhijit Chatterjee:
Spectral Estimation Based Acquisition of Incoherently Under-sampled Periodic Signals: Application to Bandwidth Interleaving. Asian Test Symposium 2012: 196-201 - [c220]Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee:
Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. ETS 2012: 1 - [c219]Abhijit Chatterjee, Sabyasachi Deyati, Barry John Muldrey, Shyam Kumar Devarakond, Aritra Banerjee:
Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits. ICCAD 2012: 553-556 - [c218]Sabyasachi Deyati, Aritra Banerjee, Abhijit Chatterjee:
Pilot symbol driven monitoring of electrical degradation in RF transmitter systems using model anomaly diagnosis. IOLTS 2012: 142-145 - [c217]Debashis Banerjee, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee:
Low-power adaptive RF system design using real-time fuzzy noise-distortion control. ISLPED 2012: 249-254 - [c216]Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee, Duane C. Howard, John D. Cressler:
A self-testable SiGe LNA and Built-in-Self-Test methodology for multiple performance specifications of RF amplifiers. ISQED 2012: 7-12 - [c215]Thomas Moon, Hyun Woo Choi, Abhijit Chatterjee:
Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling. ITC 2012: 1-9 - [c214]Nicholas Tzou, Debesh Bhatta, Sen-Wen Hsiao, Hyun Woo Choi, Abhijit Chatterjee:
Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization. ITC 2012: 1-10 - [c213]Xian Wang, Hyun Woo Choi, Thomas Moon, Nicholas Tzou, Abhijit Chatterjee:
Higher than Nyquist test waveform synthesis and digital phase noise injection using time-interleaved mixed-mode data converters. ITC 2012: 1-10 - [c212]Debashis Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Power Aware Post-Manufacture Tuning of MIMO Receiver Systems. VLSI Design 2012: 143-148 - [c211]Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee, Irtaza Barlas:
Real-Time, Content Aware Camera - Algorithm - Hardware Co-Adaptation for Minimal Power Video Encoding. VLSI Design 2012: 245-250 - [c210]Nicholas Tzou, Thomas Moon, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee:
Dual-frequency incoherent subsampling driven test response acquisition of spectrally sparse wideband signals with enhanced time resolution. VTS 2012: 140-145 - [c209]Thomas Moon, Nicholas Tzou, Xian Wang, Hyun Woo Choi, Abhijit Chatterjee:
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise. VTS 2012: 146-151 - 2011
- [j65]Georgios Karakonstantis, Abhijit Chatterjee, Kaushik Roy:
Containing the Nanometer "Pandora-Box": Cross-Layer Design Techniques for Variation Aware Low Power Systems. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(1): 19-29 (2011) - [j64]Muhammad Mudassar Nisar, Abhijit Chatterjee:
Guided Probabilistic Checksums for Error Control in Low-Power Digital Filters. IEEE Trans. Computers 60(9): 1313-1326 (2011) - [j63]Shreyas Sen, Rajarajan Senguttuvan, Abhijit Chatterjee:
Environment-Adaptive Concurrent Companding and Bias Control for Efficient Power-Amplifier Operation. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(3): 607-618 (2011) - [j62]Hyun Woo Choi, Alfred V. Gomes, Abhijit Chatterjee:
Signal Acquisition of High-Speed Periodic Signals Using Incoherent Sub-Sampling and Back-End Signal Reconstruction Algorithms. IEEE Trans. Very Large Scale Integr. Syst. 19(7): 1125-1135 (2011) - [c208]Debesh Bhatta, Joshua W. Wells, Abhijit Chatterjee:
Time Domain Characterization and Test of High Speed Signals Using Incoherent Sub-sampling. Asian Test Symposium 2011: 21-26 - [c207]Jayaram Natarajan, Joshua W. Wells, Abhijit Chatterjee, Adit D. Singh:
Distributed Comparison Test Driven Multiprocessor Speed-Tuning: Targeting Performance Gains under Extreme Process Variations. Asian Test Symposium 2011: 154-160 - [c206]Xi Qian, Adit D. Singh, Abhijit Chatterjee:
Diagnosing Multiple Slow Gates for Performance Tuning in the Face of Extreme Process Variations. Asian Test Symposium 2011: 303-310 - [c205]Sehun Kook, Aritra Banerjee, Abhijit Chatterjee:
Signature Testing and Diagnosis of High Precision S? ADC Dynamic Specifications Using Model Parameter Estimation. ETS 2011: 33-38 - [c204]Aritra Banerjee, Subho Chatterjee, Azad Naeemi, Abhijit Chatterjee:
Power Aware Post-manufacture Tuning of Analog Nanocircuits. ETS 2011: 57-62 - [c203]Jayaram Natarajan, Shreyas Sen, Abhijit Chatterjee:
Real time cross-layer adaptation for minimum energy wireless image transport using bit error rate control. IOLTS 2011: 127-132 - [c202]Shreyas Sen, Marian Verhelst, Abhijit Chatterjee:
Orthogonally tunable inductorless RF LNA for adaptive wireless systems. ISCAS 2011: 285-288 - [c201]Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Accurate signature driven power conscious tuning of RF systems using hierarchical performance models. ITC 2011: 1-9 - [c200]Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya:
Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation. VLSI Design 2011: 274-279 - [c199]Aritra Banerjee, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures. VTS 2011: 58-63 - [p1]Shreyas Sen, Vishwanath Natarajan, Abhijit Chatterjee:
Low-Power Adaptive Mixed Signal/RF Circuits and Systems and Self-Healing Solutions. Low-Power Variation-Tolerant Design in Nanometer Silicon 2011: 293-333 - 2010
- [j61]Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler:
Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems. IEEE Des. Test Comput. 27(6): 6-17 (2010) - [j60]Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee:
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles. J. Electron. Test. 26(1): 13-24 (2010) - [j59]Ganesh Srinivasan, Abhijit Chatterjee, Sasikumar Cherubal, Pramodchandran N. Variyam:
Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices. J. Electron. Test. 26(4): 405-417 (2010) - [j58]Donghoon Han, Byung-Sung Kim, Abhijit Chatterjee:
DSP-Driven Self-Tuning of RF Circuits for Process-Induced Performance Variability. IEEE Trans. Very Large Scale Integr. Syst. 18(2): 305-314 (2010) - [j57]Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh:
Post-Manufacture Tuning for Nano-CMOS Yield Recovery Using Reconfigurable Logic. IEEE Trans. Very Large Scale Integr. Syst. 18(4): 675-679 (2010) - [c198]Hyun Woo Choi, Abhijit Chatterjee:
Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling. Asian Test Symposium 2010: 9-14 - [c197]Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Rapid Radio Frequency Amplitude and Phase Distortion Measurement Using Amplitude Modulated Stimulus. Asian Test Symposium 2010: 277-282 - [c196]Shyam Kumar Devarakond, Shreyas Sen, Vishwanath Natarajan, Aritra Banerjee, Hyun Woo Choi, Ganesh Srinivasan, Abhijit Chatterjee:
Digitally Assisted Concurrent Built-In Tuning of RF Systems Using Hamming Distance Proportional Signatures. Asian Test Symposium 2010: 283-288 - [c195]Abhijit Chatterjee:
Invited talk: Self-aware wireless communication and signal processing systems: Real-time adaptation for error resilience, low power and performance. ETS 2010: 10 - [c194]Shyam Kumar Devarakond, Shreyas Sen, Aritra Banerjee, Vishwanath Natarajan, Abhijit Chatterjee:
Built-in performance monitoring of mixed-signal/RF front ends using real-time parameter estimation. IOLTS 2010: 77-82 - [c193]Joshua W. Wells, Jayaram Natarajan, Abhijit Chatterjee:
Error resilient video encoding using Block-Frame Checksums. IOLTS 2010: 289-294 - [c192]Muhammad Mudassar Nisar, Jayaram Natarajan, Abhijit Chatterjee:
Dynamic power modulation in baseband OFDM signal processor using application driven metrics: Image transmission and processing. LATW 2010: 1-6 - [c191]Abhijit Chatterjee, Friedrich Taenzler:
Low cost test and tuning of RF circuits and systems. VTS 2010: 42 - [c190]Vishwanath Natarajan, Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations. VTS 2010: 331-336 - [c189]Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee:
Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures. VTS 2010: 337-342
2000 – 2009
- 2009
- [j56]Muhammad Mudassar Nisar, Abhijit Chatterjee:
Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback. J. Low Power Electron. 5(3): 313-325 (2009) - [j55]Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers. IEEE Trans. Very Large Scale Integr. Syst. 17(6): 803-814 (2009) - [j54]Daniele Rossi, José Manuel Cazeaux, Martin Omaña, Cecilia Metra, Abhijit Chatterjee:
Accurate Linear Model for SET Critical Charge Estimation. IEEE Trans. Very Large Scale Integr. Syst. 17(8): 1161-1166 (2009) - [j53]Maryam Ashouei, Abhijit Chatterjee:
Checksum-Based Probabilistic Transient-Error Compensation for Linear Digital Systems. IEEE Trans. Very Large Scale Integr. Syst. 17(10): 1447-1460 (2009) - [c188]Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74 - [c187]Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
BIST Driven Power Conscious Post-Manufacture Tuning of Wireless Transceiver Systems Using Hardware-Iterated Gradient Search. Asian Test Symposium 2009: 243-248 - [c186]Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee:
Self-Calibrating Embedded RF Down-Conversion Mixers. Asian Test Symposium 2009: 249-254 - [c185]Abhilash Goyal, Madhavan Swaminathan, Abhijit Chatterjee:
A novel self-healing methodology for RF Amplifier circuits based on oscillation principles. DATE 2009: 1656-1661 - [c184]Abhijit Chatterjee:
Cognitive self-adaptive computing and communication systems: Test, control and adaptation. DDECS 2009: 2 - [c183]Shyam Kumar Devarakond, Shreyas Sen, Abhijit Chatterjee:
BIST assisted wideband digital compensation for MB-UWB transmitters. DDECS 2009: 84-89 - [c182]Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin:
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS 2009: 3-8 - [c181]Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan:
Iterative built-in testing and tuning of mixed-signal/RF systems. ICCD 2009: 319-326 - [c180]Abhijit Chatterjee, Jacob A. Abraham, Adit D. Singh, Elie Maricau, Rakesh Kumar, Christos A. Papachristou:
Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?. IOLTS 2009: 129 - [c179]Jayaram Natarajan, Gokul Kumar, Shreyas Sen, Muhammad Mudassar Nisar, Deuk Lee, Abhijit Chatterjee:
Aggressively voltage overscaled adaptive RF systems using error control at the bit and symbol levels. IOLTS 2009: 249-254 - [c178]Shreyas Sen, Shyam Kumar Devarakond, Abhijit Chatterjee:
Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations. ITC 2009: 1-10 - [c177]Muhammad Mudassar Nisar, Abhijit Chatterjee:
Environment and Process Adaptive Low Power Wireless Baseband Signal Processing Using Dual Real-Time Feedback. VLSI Design 2009: 57-62 - 2008
- [j52]Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. IEEE Des. Test Comput. 25(2): 150-159 (2008) - [j51]Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka:
Performance-Optimized Design for Parametric Reliability. J. Electron. Test. 24(1-3): 129-141 (2008) - [j50]Shalabh Goyal, Abhijit Chatterjee:
Linearity Testing of A/D Converters Using Selective Code Measurement. J. Electron. Test. 24(6): 567-576 (2008) - [j49]Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
Multidimensional Adaptive Power Management for Low-Power Operation of Wireless Devices. IEEE Trans. Circuits Syst. II Express Briefs 55-II(9): 867-871 (2008) - [j48]Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee:
System-Level Specification Testing Of Wireless Transceivers. IEEE Trans. Very Large Scale Integr. Syst. 16(3): 263-276 (2008) - [j47]Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems. VLSI Design 2008: 418165:1-418165:10 (2008) - [c176]Deuk Lee, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee:
Efficient Low-Cost Testing of Wireless OFDM Polar Transceiver Systems. ATS 2008: 55-60 - [c175]Shreyas Sen, Vishwanath Natarajan, Rajarajan Senguttuvan, Abhijit Chatterjee:
Pro-VIZOR: process tunable virtually zero margin low power adaptive RF for wireless systems. DAC 2008: 492-497 - [c174]Hyun Woo Choi, Abhijit Chatterjee:
Digital bit stream jitter testing using jitter expansion. DATE 2008: 1468-1473 - [c173]Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee:
Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. ETS 2008: 41-46 - [c172]Muhammad Mudassar Nisar, Abhijit Chatterjee:
Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters. IOLTS 2008: 239-244 - [c171]Shreyas Sen, Abhijit Chatterjee:
Design of process variation tolerant radio frequency low noise amplifier. ISCAS 2008: 392-395 - [c170]Vishwanath Natarajan, Hyun Woo Choi, Deuk Lee, Rajarajan Senguttuvan, Abhijit Chatterjee:
EVM Testing of Wireless OFDM Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms. ITC 2008: 1-10 - [c169]Maryam Ashouei, Adit D. Singh, Abhijit Chatterjee:
Reconfiguring CMOS as Pseudo N/PMOS for Defect Tolerance in Nano-Scale CMOS. VLSI Design 2008: 27-32 - [c168]Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
Concurrent Multi-Dimensional Adaptation for Low-Power Operation in Wireless Devices. VLSI Design 2008: 65-70 - [c167]Muhammad Mudassar Nisar, Rajarajan Senguttuvan, Abhijit Chatterjee:
Adaptive Signal Scaling Driven Critical Path Modulation for Low Power Baseband OFDM Processors. VLSI Design 2008: 71-76 - [c166]Muhammad Mudassar Nisar, Abhijit Chatterjee:
Test Enabled Process Tuning for Adaptive Baseband OFDM Processor. VTS 2008: 9-16 - [c165]Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee:
Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. VTS 2008: 175-180 - [c164]Vishwanath Natarajan, Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends. VTS 2008: 215-220 - 2007
- [j46]Shalabh Goyal, Abhijit Chatterjee, Michael Purtell:
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters. J. Electron. Test. 23(1): 95-106 (2007) - [j45]Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. 1(3): 170-179 (2007) - [j44]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee:
Delay-Assignment-Variation Based Optimization of Digital CMOS Circuits for Low Power Consumption. J. Low Power Electron. 3(1): 78-95 (2007) - [j43]Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Signature Testing of Analog and RF Circuits: Algorithms and Methodology. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 1018-1031 (2007) - [c163]Ganesh Srinivasan, Abhijit Chatterjee, Vishwanath Natarajan:
Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources. ATS 2007: 139-142 - [c162]Selim Sermet Akbay, Shreyas Sen, Abhijit Chatterjee:
Testing RF Components with Supply Current Signatures. ATS 2007: 393-398 - [c161]Selim Sermet Akbay, Abhijit Chatterjee:
Fault-based alternate test of RF components. ICCD 2007: 518-525 - [c160]Rajarajan Senguttuvan, Shreyas Sen, Abhijit Chatterjee:
VIZOR: Virtually zero margin adaptive RF for ultra low power wireless communication. ICCD 2007: 580-586 - [c159]Shreyas Sen, Rajarajan Senguttuvan, Abhijit Chatterjee:
Feedback Driven Adaptive Power Management for Minimum Power Operation of Wireless Receivers. ICECS 2007: 1019-1022 - [c158]Muhammad Mudassar Nisar, Maryam Ashouei, Abhijit Chatterjee:
Probabilistic Concurrent Error Compensation in Nonlinear Digital Filters Using Linearized Checksums. IOLTS 2007: 173-182 - [c157]Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit Chatterjee, Adit D. Singh, Abdulkadir Utku Diril:
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations. VLSI Design 2007: 711-716 - [c156]Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee:
Enhanced Resolution Jitter Testing Using Jitter Expansion. VTS 2007: 104-109 - [c155]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors. VTS 2007: 125-130 - [c154]Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee, Craig Force:
Novel Cross-Loopback Based Test Approach for Specification Test of Multi-Band, Multi-Hardware Radios. VTS 2007: 297-302 - [c153]Rajarajan Senguttuvan, Abhijit Chatterjee:
Alternate Diagnostic Testing and Compensation of RF Transmitter Performance Using Response Detection. VTS 2007: 395-400 - [i1]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee:
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. CoRR abs/0710.4720 (2007) - 2006
- [j42]Soumendu Bhattacharya, Abhijit Chatterjee:
A DFT Approach for Testing Embedded Systems Using DC Sensors. IEEE Des. Test Comput. 23(6): 464-475 (2006) - [j41]Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee:
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. J. Electron. Test. 22(4-6): 471-482 (2006) - [j40]Soumendu Bhattacharya, Sankar Nair, Abhijit Chatterjee:
An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores. IEEE Trans. Circuits Syst. I Regul. Pap. 53-I(11): 2377-2383 (2006) - [j39]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh:
Analysis and Optimization of Nanometer CMOS Circuits for Soft-Error Tolerance. IEEE Trans. Very Large Scale Integr. Syst. 14(5): 514-524 (2006) - [c152]Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh:
Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. ATS 2006: 307-312 - [c151]Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee:
Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. DATE 2006: 658-663 - [c150]Ramyanshu Datta, Jacob A. Abraham, Abdulkadir Utku Diril, Abhijit Chatterjee, Kevin J. Nowka:
Adaptive Design for Performance-Optimized Robustness. DFT 2006: 3-11 - [c149]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. ETS 2006: 35-42 - [c148]Shalabh Goyal, Abhijit Chatterjee, Mike Atia:
Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. ETS 2006: 165-172 - [c147]Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee:
Low Cost Parametric Failure Diagnosis of RF Transceivers. ETS 2006: 205-212 - [c146]Abhijit Chatterjee:
Application of the Reactivity Index to Propose Intra and Intermolecular Reactivity in Catalytic Materials. International Conference on Computational Science (3) 2006: 77-81 - [c145]Vishwanath Natarajan, Ganesh Srinivasan, Abhijit Chatterjee:
On-Line Error Detection in Wireless RF Transmitters Using Real-time Streaming Data. IOLTS 2006: 159-164 - [c144]Selim Sermet Akbay, Jose L. Torres, Julie M. Rumer, Abhijit Chatterjee, Joel Amtsfield:
Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation. ITC 2006: 1-10 - [c143]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes. LATW 2006: 192-197 - [c142]Achintya Halder, Abhijit Chatterjee:
Low-Cost Production Testing of Wireless Transmitters. VLSI Design 2006: 437-442 - [c141]Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De, T. M. Mak:
Statistical Estimation of Correlated Leakage Power Variation and Its Application to Leakage-Aware Design. VLSI Design 2006: 606-612 - [c140]Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair:
Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms. VLSI Design 2006: 729-733 - [c139]Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee:
Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors. VTS 2006: 192-199 - [c138]Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee:
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction. VTS 2006: 208-213 - [c137]Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler:
Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. VTS 2006: 222-227 - 2005
- [j38]Abhijit Chatterjee, Kapil Mayawala, Jeremy S. Edwards, Dionisios G. Vlachos:
Time accelerated Monte Carlo simulations of biological networks using the binomial r-leap method. Bioinform. 21(9): 2136-2137 (2005) - [j37]Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee:
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. J. Electron. Test. 21(3): 323-339 (2005) - [j36]Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh:
Pseudo Dual Supply Voltage Domino Logic Design. J. Low Power Electron. 1(2): 145-152 (2005) - [j35]Achintya Halder, Abhijit Chatterjee:
Test generation for specification test of analog circuits using efficient test response observation methods. Microelectron. J. 36(9): 820-832 (2005) - [j34]Soumendu Bhattacharya, Abhijit Chatterjee:
Optimized wafer-probe and assembled package test design for analog circuits. ACM Trans. Design Autom. Electr. Syst. 10(2): 303-329 (2005) - [j33]Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh:
Level-shifter free design of low power dual supply voltage CMOS circuits using dual threshold voltages. IEEE Trans. Very Large Scale Integr. Syst. 13(9): 1103-1107 (2005) - [c136]Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh:
Low-power domino circuits using NMOS pull-up on off-critical paths. ASP-DAC 2005: 533-538 - [c135]Donghoon Han, Abhijit Chatterjee:
Robust Built-In Test of RF ICs Using Envelope Detectors. Asian Test Symposium 2005: 2-7 - [c134]Achintya Halder, Abhijit Chatterjee:
Low-cost Production Test of BER for Wireless Receivers. Asian Test Symposium 2005: 64-69 - [c133]Chung-Seok (Andy) Seo, Abhijit Chatterjee, Timothy J. Drabik, Behnam S. Arad, Reena Patel:
Prototyping an Embedded Bus-Based Parallel System. CATA 2005: 314-319 - [c132]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee:
Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits. DATE 2005: 288-293 - [c131]Ganesh Srinivasan, Sasikumar Cherubal, Pramodchandran N. Variyam, Melese Teklu, C. P. Wang, David Guidry, Abhijit Chatterjee:
Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers. ETS 2005: 68-73 - [c130]Maryam Ashouei, Abhijit Chatterjee, Adit D. Singh, Vivek De:
A Dual-Vt Layout Approach for Statistical Leakage Variability Minimization in Nanometer CMOS. ICCD 2005: 567-573 - [c129]José Manuel Cazeaux, Daniele Rossi, Martin Omaña, Cecilia Metra, Abhijit Chatterjee:
On Transistor Level Gate Sizing for Increased Robustness to Transient Faults. IOLTS 2005: 23-28 - [c128]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Cecilia Metra:
Load and Logic Co-Optimization for Design of Soft-Error Resistant Nanometer CMOS Circuits. IOLTS 2005: 35-40 - [c127]Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111 - [c126]Chung-Seok (Andy) Seo, Abhijit Chatterjee, Nan M. Jokerst:
This paper presents a cost-effective area-IO DRAM A CAD Tool and Algorithms. ISQED 2005: 567-572 - [c125]Hosam Haggag, Abhijit Chatterjee:
Panel synopsis: reducing high-speed/RF test cost: guaranteed by design or guaranteed to fail? ITC 2005: 1 - [c124]Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag:
Test time reduction of successive approximation register A/D converter by selective code measurement. ITC 2005: 8 - [c123]Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee:
Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF. ITC 2005: 10 - [c122]Abhijit Chatterjee, Ali Keshavarzi, Amit Patra, Siddhartha Mukhopadhyay:
Test Methodologies in the Deep Submicron Era - Analog, Mixed-Signal, and RF. VLSI Design 2005: 12-13 - [c121]Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh:
Level-Shifter Free Design of Low Power Dual Supply Voltage CMOS Circuits Using Dual Threshold Voltages. VLSI Design 2005: 159-164 - [c120]Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee:
A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. VLSI Design 2005: 289-294 - [c119]Soumendu Bhattacharya, Abhijit Chatterjee:
Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices. VTS 2005: 137-142 - [c118]Selim Sermet Akbay, Abhijit Chatterjee:
Built-In Test of RF Components Using Mapped Feature Extraction Sensors. VTS 2005: 243-248 - [c117]Achintya Halder, Abhijit Chatterjee:
Low-Cost Alternate EVM Test for Wireless Receiver Systems. VTS 2005: 255-260 - [c116]Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Abhijit Chatterjee, Adit D. Singh:
Design of Adaptive Nanometer Digital Systems for Effective Control of Soft Error Tolerance. VTS 2005: 298-303 - 2004
- [j32]Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian:
Distributed Diagnosis of Interconnections in SoC and MCM Designs. J. Electron. Test. 20(3): 291-307 (2004) - [c115]Soumendu Bhattacharya, Abhijit Chatterjee:
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. Asian Test Symposium 2004: 68-73 - [c114]Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. Asian Test Symposium 2004: 302-307 - [c113]Donghoon Han, Abhijit Chatterjee:
Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study. Asian Test Symposium 2004: 420-425 - [c112]Chung-Seok (Andy) Seo, Abhijit Chatterjee, Timothy J. Drabik:
Optically Interconnected Intelligent RAM Multiprocessor: Gigascale Opto-IRAM. CATA 2004: 256-260 - [c111]Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee:
Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285 - [c110]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee:
Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377 - [c109]Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh:
Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. ETS 2004: 24-29 - [c108]Chung-Seok (Andy) Seo, Abhijit Chatterjee, Sang-Yeon Cho, Nan M. Jokerst:
Design and optimization of board-level optical clock distribution network for high-performance optoelectronic system-on-a-packages. ACM Great Lakes Symposium on VLSI 2004: 292-297 - [c107]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh:
Sizing CMOS Circuits for Increased Transient Error Tolerance. IOLTS 2004: 11-16 - [c106]Achintya Halder, Abhijit Chatterjee:
Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. ISQED 2004: 401-406 - [c105]Ashwin Raghunathan, Ji Hwan (Paul) Chun, Jacob A. Abraham, Abhijit Chatterjee:
Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters. ITC 2004: 252-261 - [c104]Soumendu Bhattacharya, Abhijit Chatterjee:
Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC 2004: 801-809 - [c103]Donghoon Han, Abhijit Chatterjee:
Simulation-in-the-Loop Analog Circuit Sizing Method using Adaptive Model-based Simulated Annealing. IWSOC 2004: 127-130 - [c102]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Adit D. Singh:
Low-power dual Vth pseudo dual Vdd domino circuits. SBCCI 2004: 273-277 - [c101]Donghoon Han, Abhijit Chatterjee:
Adaptive response surface modeling-based method for analog circuit sizing. SoCC 2004: 109-112 - [c100]Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John McLaughlin, Jason L. Smith, David M. Majernik:
Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design 2004: 1017-1022 - [c99]Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee:
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236 - [c98]Selim Sermet Akbay, Abhijit Chatterjee:
Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. VTS 2004: 273-290 - [c97]Ashwin Raghunathan, Hongjoong Shin, Jacob A. Abraham, Abhijit Chatterjee:
Prediction of Analog Performance Parameters Using Oscillation Based Test. VTS 2004: 377-382 - 2003
- [j31]Junwei Hou, Abhijit Chatterjee:
Concurrent transient fault simulation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 22(10): 1385-1398 (2003) - [c96]Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh, Namsoo P. Kim, Mark T. Chisa:
IC Reliability Simulator ARET and Its Application in Design-for-Reliability. Asian Test Symposium 2003: 18-23 - [c95]Yuvraj Singh Dhillon, Abdulkadir Utku Diril, Abhijit Chatterjee, Hsien-Hsin S. Lee:
Algorithm for Achieving Minimum Energy Consumption in CMOS Circuits Using Multiple Supply and Threshold Voltages at the Module Level. ICCAD 2003: 693-700 - [c94]Kyu-won Choi, Abhijit Chatterjee:
UDSM (ultra-deep sub-micron)-aware post-layout power optimization for ultra low-power CMOS VLSI. ISLPED 2003: 72-77 - [c93]Abdulkadir Utku Diril, Yuvraj Singh Dhillon, Kyu-won Choi, Abhijit Chatterjee:
An O(N)Supply Voltage Assignment Algorithm for Low-Energy Serially Connected CMOS Modules and a Heuristic Extension to Acyclic Data Flow Graphs. ISVLSI 2003: 173-182 - [c92]Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee:
Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models. ITC 2003: 665-673 - [c91]Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee:
Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181 - [c90]Abhijit Chatterjee:
Seamless Research Between Academia And Industry To Facilitate Test Of Integrated High-Speed Wireless Systems: Is This An Illusion? ITC 2003: 1287 - [c89]Chung-Seok (Andy) Seo, Abhijit Chatterjee:
Free-Space Optical Interconnect for High-Performance MCM Systems. IWSOC 2003: 294-298 - [c88]Soumendu Bhattacharya, Abhijit Chatterjee:
High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost. VTS 2003: 89-100 - 2002
- [j30]Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee:
Prediction of analog performance parameters using fast transienttesting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(3): 349-361 (2002) - [c87]Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee:
A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE 2002: 186-191 - [c86]Soumendu Bhattacharya, Abhijit Chatterjee:
Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models. DELTA 2002: 25-32 - [c85]Chung-Seok (Andy) Seo, Abhijit Chatterjee:
A CAD Tool for System-on-Chip Placement and Routing with Free-Space Optical Interconnect. ICCD 2002: 24-29 - [c84]Huy Nguyen, Abhijit Chatterjee:
Design of Real-Number Checksum Codes Using Shared Partial Computation for CED in Linear DSP Systems. IOLTW 2002: 61- - [c83]Kyu-won Choi, Abhijit Chatterjee:
HA2TSD: hierarchical time slack distribution for ultra-low power CMOS VLSI. ISLPED 2002: 207-212 - [c82]Abhijit Chatterjee, Peeter Ellervee, Vincent John Mooney III, Jun-Cheol Park, Kyu-won Choi, Kiran Puttaswamy:
System Level Power-Performance Trade-Offs in Embedded Systems Using Voltage and Frequency Scaling of Off-Chip Buses and Memory. ISSS 2002: 225-230 - [c81]Kyu-won Choi, Abhijit Chatterjee:
PA-ZSA (Power-Aware Zero-Slack Algorithm): A Graph-Based Timing Analysis for Ultra-Low Power CMOS VLSI. PATMOS 2002: 178-187 - [c80]Achintya Halder, Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley:
Measuring Stray Capacitance on Tester Hardware. VTS 2002: 351-356 - 2001
- [j29]Koppolu Sasidhar, Abhijit Chatterjee:
Hierarchical Diagnosis of Identical Units in a System. IEEE Trans. Computers 50(2): 186-191 (2001) - [j28]Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian:
Boundary Scan-Based Relay Wave Propagation Test of Arrays of Identical Structures. IEEE Trans. Computers 50(10): 1007-1019 (2001) - [j27]Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian:
Switching activity generation with automated BIST synthesis forperformance testing of interconnects. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(9): 1143-1158 (2001) - [j26]Pankaj Pant, Yuan-Chieh Hsu, Sandeep K. Gupta, Abhijit Chatterjee:
Path delay fault diagnosis in combinational circuits with implicitfault enumeration. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(10): 1226-1235 (2001) - [c79]Achintya Halder, Abhijit Chatterjee:
Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. Asian Test Symposium 2001: 344- - [c78]Biranchinath Sahu, Abhijit Chatterjee:
Automatic Test Generation for Analog Circuits Using Compact Test Transfer Function Models. Asian Test Symposium 2001: 405-410 - [c77]Alfred V. Gomes, Abhijit Chatterjee:
Distance Constrained Dimensionality Reduction for Parametric Fault Test Generator. Asian Test Symposium 2001: 411-416 - [c76]Sasikumar Cherubal, Abhijit Chatterjee:
Test generation based diagnosis of device parameters for analog circuits. DATE 2001: 596-602 - [c75]Xiangdong Xuan, Abhijit Chatterjee:
Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. DFT 2001: 323-328 - [c74]Kyu-won Choi, Abhijit Chatterjee:
Efficient instruction-level optimization methodology for low-power embedded systems. ISSS 2001: 147-152 - [c73]Sasikumar Cherubal, Abhijit Chatterjee:
A high-resolution jitter measurement technique using ADC sampling. ITC 2001: 838-847 - 2000
- [j25]Pramodchandran N. Variyam, Abhijit Chatterjee:
Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. IEEE Des. Test Comput. 17(3): 106-115 (2000) - [j24]Pramodchandran N. Variyam, Abhijit Chatterjee:
Specification-driven test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 19(10): 1189-1201 (2000) - [c72]Sasikumar Cherubal, Abhijit Chatterjee:
Test generation for fault isolation in analog circuits using behavioral models. Asian Test Symposium 2000: 19-24 - [c71]Sudip Chakrabarti, Abhijit Chatterjee:
Partial Simulation-Driven ATPG for Detection and Diagnosis of Faults in Analog Circuits. ICCAD 2000: 562-567 - [c70]Junwei Hou, Abhijit Chatterjee:
Analog Transient Concurrent Fault Simulation with Dynamic Fault Grouping. ICCD 2000: 35-41 - [c69]Pankaj Pant, Abhijit Chatterjee:
Path-delay fault diagnosis in non-scan sequential circuits with at-speed test application. ITC 2000: 245-252 - [c68]Sasikumar Cherubal, Abhijit Chatterjee:
Optimal INL/DNL testing of A/D converters using a linear model. ITC 2000: 358-366 - [c67]Sasikumar Cherubal, Abhijit Chatterjee:
An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. VLSI Design 2000: 550-555 - [c66]Ramakrishna Voorakaranam, Abhijit Chatterjee:
Test Generation for Accurate Prediction of Analog Specifications. VTS 2000: 137-142
1990 – 1999
- 1999
- [j23]Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee:
Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits. J. Electron. Test. 14(3): 259-272 (1999) - [j22]Rajesh Pendurkar, Craig A. Tovey, Abhijit Chatterjee:
Single-probe traversal optimization for testing of MCM substrate interconnections. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(8): 1178-1191 (1999) - [j21]Heebyung Yoon, Junwei Hou, Swapan K. Bhattacharya, Abhijit Chatterjee, Madhavan Swaminathan:
Fault Detection and Automated Fault Diagnosis for Embedded Integrated Electrical Passives. J. VLSI Signal Process. 21(3): 265-276 (1999) - [c65]Sudip Chakrabarti, Abhijit Chatterjee:
Compact Fault Dictionary Construction for Efficient Isolation of Faults in Analog and Mixed-Signal Circuits. ARVLSI 1999: 327-341 - [c64]Ramakrishna Voorakaranam, Abhijit Chatterjee:
Feedback Driven Backtrace of Analog Signals and its Application to Circuit Verification and Test. ARVLSI 1999: 342-357 - [c63]Alfred V. Gomes, Abhijit Chatterjee:
Minimal Length Diagnostic Tests for Analog Circuits using Test History. DATE 1999: 189-194 - [c62]Sasikumar Cherubal, Abhijit Chatterjee:
Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. DATE 1999: 195- - [c61]Sasikumar Cherubal, Abhijit Chatterjee:
A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. DFT 1999: 357- - [c60]Alfred V. Gomes, Abhijit Chatterjee:
Robust optimization based backtrace method for analog circuits. ICCAD 1999: 304-308 - [c59]Pankaj Pant, Abhijit Chatterjee:
Efficient diagnosis of path delay faults in digital logic circuits. ICCAD 1999: 471-476 - [c58]Sudip Chakrabarti, Abhijit Chatterjee:
Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits. ISCAS (2) 1999: 444-447 - [c57]Junwei Hou, William H. Kao, Abhijit Chatterjee:
A novel concurrent fault simulation method for mixed-signal circuits. ISCAS (2) 1999: 448-451 - [c56]Sudip Chakrabarti, Abhijit Chatterjee:
On-line fault detection in DSP circuits using extrapolated checksums with minimal test points. ITC 1999: 955-963 - [c55]Sudip Chakrabarti, Abhijit Chatterjee:
Diagnostic Test Pattern Generation for Analog Circuits Using Hierarchical Models. VLSI Design 1999: 518-523 - [c54]Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
Test Generation for Analog Circuits Using Partial Numerical Simulation. VLSI Design 1999: 597-602 - [c53]Manuel d'Arbreu, Abhijit Chatterjee:
Manufacturability of Mixed Signal Systems. VLSI Design 1999: 608 - [c52]Pramodchandran N. Variyam, Junwei Hou, Abhijit Chatterjee:
Efficient Test Generation for Transient Testing of Analog Circuits Using Partial Numerical Simulation. VTS 1999: 214-219 - [c51]Ramakrishna Voorakaranam, Abhijit Chatterjee:
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development. VTS 1999: 296-303 - 1998
- [j20]Koppolu Sasidhar, Leon Alkalai, Abhijit Chatterjee:
Testing NASA's 3D-Stack MCM Space Flight Computer. IEEE Des. Test Comput. 15(3): 44-55 (1998) - [j19]Naveena Nagi, Abhijit Chatterjee, Heebyung Yoon, Jacob A. Abraham:
Signature analysis for analog and mixed-signal circuit test response compaction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(6): 540-546 (1998) - [j18]Huy T. Nguyen, Abhijit Chatterjee, Rabindra K. Roy:
Activity Measures for Fast Relative Power Estimation in Numerical Transformation for Low Power DSP Synthesis. J. VLSI Signal Process. 18(1): 25-38 (1998) - [c50]Pramodchandran N. Variyam, Abhijit Chatterjee:
Specification-Driven Test Design for Analog Circuits. DFT 1998: 335-340 - [c49]Alfred V. Gomes, Ramakrishna Voorakaranam, Abhijit Chatterjee:
Modular Fault Simulation of Mixed Signal Circuits with Fault Ranking by Severity. DFT 1998: 341-348 - [c48]Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian:
Synthesis of BIST hardware for performance testing of MCM interconnections. ICCAD 1998: 69-73 - [c47]Junwei Hou, Abhijit Chatterjee:
CONCERT: a concurrent transient fault simulator for nonlinear analog circuits. ICCAD 1998: 384-391 - [c46]Heebyung Yoon, Junwei Hou, Abhijit Chatterjee, Madhavan Swaminathan:
Fault detection and automated fault diagnosis for embedded integrated electrical passives. ICCD 1998: 588-593 - [c45]Rajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian:
A distributed BIST technique for diagnosis of MCM interconnections. ITC 1998: 214-221 - [c44]Bruce C. Kim, David C. Keezer, Abhijit Chatterjee:
A high throughput test methodology for MCM substrates. ITC 1998: 234-240 - [c43]Huy Nguyen, Rabindra K. Roy, Abhijit Chatterjee:
Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits. VLSI Design 1998: 199-204 - [c42]Pramodchandran N. Variyam, Abhijit Chatterjee:
Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements. VTS 1998: 132-137 - [c41]Heebyung Yoon, Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits. VTS 1998: 145-151 - 1997
- [j17]Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee:
A Survey of Test Techniques for MCM Substrates. J. Electron. Test. 10(1-2): 27-38 (1997) - [j16]Abhijit Chatterjee, Rabindra K. Roy:
Concurrent Error Detection in Nonlinear Digital Circuits Using Time-Freeze Linearization. IEEE Trans. Computers 46(11): 1208-1218 (1997) - [c40]Pankaj Pant, Vivek De, Abhijit Chatterjee:
Device-Circuit Optimization for Minimal Energy and Power Consumption in CMOS Random Logic Networks. DAC 1997: 403-408 - [c39]Pramodchandran N. Variyam, Abhijit Chatterjee:
Test generation for comprehensive testing of linear analog circuits using transient response sampling. ICCAD 1997: 382-385 - [c38]Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao:
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC 1997: 903-912 - [c37]Abhijit Chatterjee, Naveena Nagi:
Design for Testability and Built-In Self-Test of Mixed-Signal Circuits: A Tutorial. VLSI Design 1997: 388-392 - [c36]Heebyung Yoon, Abhijit Chatterjee, Joseph L. A. Hughes:
Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits. VLSI Design 1997: 393-397 - [c35]Pramodchandran N. Variyam, Abhijit Chatterjee:
FLYER: Fast Fault Simulation of Linear Analog Circuits Using Polynomial Waveform and Perturbed State Representation. VLSI Design 1997: 408-412 - [c34]Huy Nguyen, Abhijit Chatterjee, Rabindra K. Roy:
Impact of Partial Reset on Fault Independent Testing and BIST. VLSI Design 1997: 537-539 - [c33]Pramodchandran N. Variyam, Abhijit Chatterjee, Naveena Nagi:
Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling. VTS 1997: 261-266 - 1996
- [j15]Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
DC Built-In Self-Test for Linear Analog Circuits. IEEE Des. Test Comput. 13(2): 26-33 (1996) - [j14]Ashok Balivada, Hong Zheng, Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham:
A unified approach for fault simulation of linear mixed-signal circuits. J. Electron. Test. 9(1-2): 29-41 (1996) - [c32]Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian:
Relay Propagation Scheme for Testing of MCMs on Large Area Substrates. ED&TC 1996: 131-137 - [c31]Rajesh Pendurkar, Abhijit Chatterjee, Craig A. Tovey:
Optimal single probe traversal algorithm for testing of MCM substrat. ICCD 1996: 396-401 - [c30]Koppolu Sasidhar, Abhijit Chatterjee, Yervant Zorian:
Optimal Multiple Chain Relay Testing Scheme for MCMs on Large Area Substrates. ITC 1996: 818-827 - [c29]Koppolu Sasidhar, Abhijit Chatterjee:
Hierarchical Probablistic Diagnosis of MCMs on Large-Area Substrates. VLSI Design 1996: 65-68 - [c28]Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi:
Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design 1996: 230-233 - [c27]Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan:
Low-cost diagnosis of defects in MCM substrate interconnections. VTS 1996: 260-265 - [c26]Abhijit Chatterjee, Rathish Jayabharathi, Pankaj Pant, Jacob A. Abraham:
Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages. VTS 1996: 354-361 - 1995
- [j13]Abhijit Chatterjee, Charles F. Machala III, Ping Yang:
A submicron DC MOSFET model for simulation of analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(10): 1193-1207 (1995) - [c25]Huy Nguyen, Abhijit Chatterjee:
OPTIMUS: a new program for OPTIMizing linear circuits with number-splitting and shift-and-add decompositions. ARVLSI 1995: 258-271 - [c24]Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel:
A Novel Low-Cost Approach to MCM Interconnect Test. ITC 1995: 184-192 - [c23]Koppolu Sasidhar, Abhijit Chatterjee, Vinod K. Agarwal, Joseph L. A. Hughes:
Distributed Probabilistic Diagnosis of MCMs on Large Area. ITC 1995: 208-216 - [c22]Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham:
Efficient multisine testing of analog circuits. VLSI Design 1995: 234-238 - 1994
- [j12]Kaushik Roy, Abhijit Chatterjee:
Guest Editors' Introduction: Low-Power VLSI Design. IEEE Des. Test Comput. 11(4): 6-7 (1994) - [c21]Abhijit Chatterjee, Jacob A. Abraham:
RAFT191486: a novel program for rapid-fire test and diagnosis of digital logic for marginal delays and delay faults. ICCAD 1994: 340-343 - [c20]Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham:
A Signature Analyzer for Analog and Mixed-signal Circuits. ICCD 1994: 284-287 - [c19]Abhijit Chatterjee, Rabindra K. Roy:
Synthesis of Low Power Linear DSP Circuits Using Activity Metrics. VLSI Design 1994: 265-270 - [c18]Abhijit Chatterjee, Rabindra K. Roy:
Design for diagnosability of linear digital filters using time-space expansion. VTS 1994: 48-53 - 1993
- [j11]Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham:
Fault simulation of linear analog circuits. J. Electron. Test. 4(4): 345-360 (1993) - [j10]Abhijit Chatterjee, Partha Pratim Das, Soumendu Bhattacharya:
Visualization in linear programming using parallel coordinates. Pattern Recognit. 26(11): 1725-1736 (1993) - [j9]Abhijit Chatterjee, Manuel A. d'Abreu:
The Design of Fault-Tolerant Linear Digital State Variable Systems: Theory and Techniques. IEEE Trans. Computers 42(7): 794-808 (1993) - [j8]Abhijit Chatterjee:
Concurrent error detection and fault-tolerance in linear analog circuits using continuous checksums. IEEE Trans. Very Large Scale Integr. Syst. 1(2): 138-150 (1993) - [j7]Abhijit Chatterjee, Rabindra K. Roy, Manuel A. d'Abreu:
Greedy hardware optimization for linear digital circuits using number splitting and refactorization. IEEE Trans. Very Large Scale Integr. Syst. 1(4): 423-431 (1993) - [c17]Abhijit Chatterjee, Rabindra K. Roy:
An Architectural Transformation Program for Optimization of Digital Systems by Multi-Level Decomposition. DAC 1993: 343-348 - [c16]Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham:
DRAFTS: Discretized Analog Circuit Fault Simulator. DAC 1993: 509-514 - [c15]Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham:
Fault-based automatic test generator for linear analog circuits. ICCAD 1993: 88-91 - [c14]Naveena Nagi, Abhijit Chatterjee, Jacob A. Abraham:
MIXER: Mixed-Signal Fault Simulator. ICCD 1993: 568-571 - [c13]Abhijit Chatterjee, Rabindra K. Roy:
Concurrent Error Detection in Nonlinear Digital Circuits with Applications to Adaptive Filters. ICCD 1993: 606-609 - [c12]Abhijit Chatterjee, Rabindra K. Roy, Manuel A. d'Abreu:
Greedy Hardware Optimization for Linear Digital Systems Using Number Splitting. VLSI Design 1993: 154-159 - 1992
- [c11]Rabindra K. Roy, Abhijit Chatterjee, Janak H. Patel, Jacob A. Abraham, Manuel A. d'Abreu:
Automatic test generation for linear digital systems with bi-level search using matrix transform methods. ICCAD 1992: 224-228 - [c10]Abhijit Chatterjee:
A New Approach to Fault-Tolerance in Linear Analog Systems Based on Checksum-Coded State Space Representations. ICCD 1992: 478-481 - [c9]Rabindra K. Roy, Naveena Nagi, Abhijit Chatterjee, Manuel A. d'Abreu:
Delay fault testing of iterative arithmetic arrays. VTS 1992: 25-30 - [c8]Abhijit Chatterjee:
Checksum-based concurrent error detection in linear analog systems with second and higher order stages. VTS 1992: 286-291 - 1991
- [j6]Abhijit Chatterjee, Rabindra K. Roy, Jacob A. Abraham, Janak H. Patel:
Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors. Digit. Signal Process. 1(4): 231-244 (1991) - [j5]Richard I. Hartley, Kenneth Welles II, Michael J. Hartman, Abhijit Chatterjee, Paul Delano, Barbara Molnar, Colin Rafferty:
A Rapid-Prototyping Environment for Digital-Signal Processors. IEEE Des. Test Comput. 8(2): 11-25 (1991) - [j4]Abhijit Chatterjee, Jacob A. Abraham:
Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling. J. Electron. Test. 2(4): 351-372 (1991) - [j3]Abhijit Chatterjee, Jacob A. Abraham:
Test Generation for Iterative Logic Arrays Based on an N-Cube of Cell States Model. IEEE Trans. Computers 40(10): 1133-1148 (1991) - [c7]Abhijit Chatterjee, Manuel A. d'Abreu:
Concurrent Error Detection and Fault-Tolerance in Linear Digital State Variable Systems. FTCS 1991: 136-143 - [c6]Abhijit Chatterjee, Manuel A. d'Abreu:
Syndrome-Based Functional Delay Fault Location in Linear Digital Data-Flow Graphs. ICCD 1991: 212-215 - [c5]Abhijit Chatterjee:
Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums. ITC 1991: 582-591 - 1990
- [b1]Abhijit Chatterjee:
The testability of regular logic structures. University of Illinois Urbana-Champaign, USA, 1990 - [j2]Abhijit Chatterjee, Jacob A. Abraham:
The Testability of Generalized Counters Under Multiple Faulty Cells. IEEE Trans. Computers 39(11): 1378-1385 (1990) - [c4]Abhijit Chatterjee, Richard I. Hartley:
A New Simultaneous Circuit Partitioning and Chip Placement Approach Based on Simulated Annealing. DAC 1990: 36-39 - [c3]Richard I. Hartley, Kenneth Welles II, Michael J. Hartman, Paul Delano, Abhijit Chatterjee:
Rapid prototyping using high density interconnects. EURO-DAC 1990: 439-443
1980 – 1989
- 1988
- [c2]Abhijit Chatterjee, Charles F. Machala III, Ping Yang:
A submicron MOSFET model for simulation of analog circuits. ICCAD 1988: 120-123 - [c1]Abhijit Chatterjee, Jacob A. Abraham:
NCUBE: an automatic test generation program for iterative logic arrays. ICCAD 1988: 428-431 - 1987
- [j1]Abhijit Chatterjee, Jacob A. Abraham:
On the C-Testability of Generalized Counters. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 6(5): 713-726 (1987)
Coauthor Index
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