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ORCIDHamidreza Hashempour
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- affiliation: Northeastern University, Boston, USA
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2020 – today
- 2024
[j14]Hamidreza Hashempour
, Hamed Bastami, Majid Moradikia, Seyed A. Zekavat, Hamid Behroozi, Gilberto Berardinelli, A. Lee Swindlehurst:
Secure SWIPT in the Multiuser STAR-RIS Aided MISO Rate Splitting Downlink. IEEE Trans. Veh. Technol. 73(9): 13466-13481 (2024)- 2022
- [j13]Hamidreza Hashempour, Majid Moradikia, Hamed Bastami, Ahmed Abdelhadi, Mojtaba Soltanalian:
Fast and Robust LRSD-Based SAR/ISAR Imaging and Decomposition. IEEE Trans. Geosci. Remote. Sens. 60: 1-13 (2022) - [i2]Hamidreza Hashempour, Hamed Bastami, Majid Moradikia, Seyed A. Zekavat, Hamid Behroozi, A. Lee Swindlehurst:
Secure SWIPT in STAR-RIS Aided Downlink MISO Rate-Splitting Multiple Access Networks. CoRR abs/2211.09081 (2022) - 2021
- [j12]Amir Ghalamzan E, Kiyanoush Nazari, Hamidreza Hashempour, Fangxun Zhong:
Deep-LfD: Deep robot learning from demonstrations. Softw. Impacts 9: 100087 (2021) - [j11]Majid Moradikia, Sadegh Samadi, Hamidreza Hashempour, Müjdat Çetin:
Video-SAR Imaging of Dynamic Scenes Using Low-Rank and Sparse Decomposition. IEEE Trans. Computational Imaging 7: 384-398 (2021) - 2020
- [i1]Hamidreza Hashempour, Kiyanoush Nazari, Fangxun Zhong, Amir Ghalamzan E:
A data-set of piercing needle through deformable objects for Deep Learning from Demonstrations. CoRR abs/2012.02458 (2020)
2010 – 2019
- 2017
- [j10]Hamidreza Hashempour, Mohammad Ali Masnadi-Shirazi:
Inverse synthetic aperture radar phase adjustment and cross-range scaling based on sparsity. Digit. Signal Process. 68: 93-101 (2017) - 2012
- [j9]Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29(5): 72-80 (2012) - 2011
- [c19]Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing:
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE 2011: 371-376 - [c18]Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui:
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT 2011: 139-145 - [c17]Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing:
Defect Oriented Testing for analog/mixed-signal devices. ITC 2011: 1-10 - 2010
- [c16]Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger:
Defect-oriented cell-internal testing. ITC 2010: 285-294
2000 – 2009
- 2009
- [j8]Faizal Karim, Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Konrad Walus, André Ivanov, Fabrizio Lombardi:
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. J. Electron. Test. 25(1): 55-66 (2009) - [c15]Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10 - 2008
- [j7]Hamidreza Hashempour, Fabrizio Lombardi:
Device Model for Ballistic CNFETs Using the First Conducting Band. IEEE Des. Test Comput. 25(2): 178-186 (2008) - [j6]Hamidreza Hashempour, Fabrizio Lombardi:
Evaluation and Analysis of Heuristic Techniques for Vector Ordering of VLSI Test Sets. IEEE Trans. Instrum. Meas. 57(9): 1998-2004 (2008) - 2007
- [j5]Hamidreza Hashempour, Fabrizio Lombardi, Warren Necoechea, Rakesh Mehta, Tim Alton:
An Integrated Environment for Design Verification of ATE Systems. IEEE Trans. Instrum. Meas. 56(5): 1734-1743 (2007) - [c14]Hamidreza Hashempour, Fabrizio Lombardi:
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs. DATE 2007: 841-846 - [c13]Marco Ottavi, Hamidreza Hashempour, Vamsi Vankamamidi, Faizal Karim, Konrad Walus, André Ivanov:
On the Error Effects of Random Clock Shifts in Quantum-Dot Cellular Automata Circuits. DFT 2007: 487-495 - 2006
- [c12]Hamidreza Hashempour, Fabrizio Lombardi:
A Novel Methodology for Functional Test Data Compression. DFT 2006: 128-135 - 2005
- [j4]Hamidreza Hashempour, Fabrizio Lombardi:
Application of Arithmetic Coding to Compression of VLSI Test Data. IEEE Trans. Computers 54(9): 1166-1177 (2005) - [j3]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi:
Evaluation, analysis, and enhancement of error resilience for reliable compression of VLSI test data. IEEE Trans. Instrum. Meas. 54(5): 1761-1769 (2005) - [j2]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Analysis and evaluation of multisite testing for VLSI. IEEE Trans. Instrum. Meas. 54(5): 1770-1778 (2005) - [c11]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi:
Evaluation of Error-Resilience for Reliable Compression of Test Data. DATE 2005: 1284-1289 - [c10]Hamidreza Hashempour, Fabrizio Lombardi:
Two dimensional reordering of functional test data for compression by ATE. ACM Great Lakes Symposium on VLSI 2005: 188-192 - [c9]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi:
Enhancing error resilience for reliable compression of VLSI test data. ACM Great Lakes Symposium on VLSI 2005: 371-376 - [c8]Hamidreza Hashempour, Fabrizio Lombardi:
Improving Error Resilience for Compressed Test Sets by Don't Care Assignment. SoCC 2005: 65-68 - 2004
- [j1]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Analysis and measurement of fault coverage in a combined ATE and BIST environment. IEEE Trans. Instrum. Meas. 53(2): 300-307 (2004) - [c7]Hamidreza Hashempour, Fabrizio Lombardi:
Compression of VLSI Test Data by Arithmetic Coding. DFT 2004: 150-157 - [c6]Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi:
Error-Resilient Test Data Compression Using Tunstall Codes. DFT 2004: 316-323 - [c5]Hamidreza Hashempour, Fabrizio Lombardi:
Evaluation of heuristic techniques for test vector ordering. ACM Great Lakes Symposium on VLSI 2004: 96-99 - 2003
- [c4]Hamidreza Hashempour, Fabrizio Lombardi:
ATE-Amenable Test Data Compression with No Cyclic Scan. DFT 2003: 151-158 - [c3]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi, Farzin Karimi:
Hybrid Multisite Testing at Manufacturing. ITC 2003: 927-936 - 2002
- [c2]Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park:
A Test-Vector Generation Methodology for Crosstalk Noise Faults. DFT 2002: 40-50 - [c1]Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi:
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. DFT 2002: 186-194
Coauthor Index
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