"A Scan Chain Adjustment Technology for Test Power Reduction."

Jia Li, Yu Hu, Xiaowei Li (2006)

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DOI: 10.1109/ATS.2006.260986

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-15

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Jia Li, Yu Hu, Xiaowei Li:
A Scan Chain Adjustment Technology for Test Power Reduction. ATS 2006: 11-16

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