"Estimating t-Way Fault Profile Evolution During Testing."

D. Richard Kuhn, Raghu N. Kacker, Yu Lei (2016)

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DOI: 10.1109/COMPSAC.2016.110

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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D. Richard Kuhn, Raghu N. Kacker, Yu Lei:
Estimating t-Way Fault Profile Evolution During Testing. COMPSAC Workshops 2016: 596-597

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