"Built-in self-test with weighted random pattern hardware."

Franc Brglez, Clay S. Gloster Jr., Gershon Kedem (1990)

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DOI: 10.1109/ICCD.1990.130190

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Franc Brglez, Clay S. Gloster Jr., Gershon Kedem:
Built-in self-test with weighted random pattern hardware. ICCD 1990: 161-166

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