"Reliability Challenges with Self-Heating and Aging in FinFET Technology."

Hussam Amrouch et al. (2019)

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DOI: 10.1109/IOLTS.2019.8854405

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel:
Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS 2019: 68-71

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