"Built-In Self Test for Low Cost Testing of a 60 MHz Synchronous Flash Memory."

Gaetano Palumbo et al. (2001)

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DOI: 10.1109/OLT.2001.937841

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Gaetano Palumbo, Giuseppe Introvaia, Vincenzo Mastrocola, Promod Kumar, Francesco Pipiton:
Built-In Self Test for Low Cost Testing of a 60 MHz Synchronous Flash Memory. IOLTW 2001: 192-196

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