"PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: ..."

Eduard Cartier et al. (2018)

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DOI: 10.1109/IRPS.2018.8353604

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Eduard Cartier, Martin M. Frank, Takashi Ando, John Rozen, Vijay Narayanan:
PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation. IRPS 2018: 5

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