"Statistical Characterization of Off-State Stress Degradation in Planar ..."

Pablo Saraza-Canflanca et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529367

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Pablo Saraza-Canflanca, Dishant Sangani, Javier Diaz-Fortuny, Stanislav Tyaginov, Georges G. E. Gielen, Erik Bury, Ben Kaczer:
Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays. IRPS 2024: 8

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