default search action
"Proceedings IEEE International Test Conference 1993, Designing, Testing, ..."
- Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. IEEE Computer Society 1993, ISBN 0-7803-1430-1 [contents]
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.