"High Quality Tests for Switch-Level Circuits Using Current and Logic Test ..."

Chun-Hung Chen, Jacob A. Abraham (1991)

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DOI: 10.1109/TEST.1991.519725

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Chun-Hung Chen, Jacob A. Abraham:
High Quality Tests for Switch-Level Circuits Using Current and Logic Test Generation Algorithms. ITC 1991: 615-622

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