"Test Pattern Generation for Realistic Bridge Faults in CMOS ICs."

F. Joel Ferguson, Tracy Larrabee (1991)

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DOI: 10.1109/TEST.1991.519711

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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F. Joel Ferguson, Tracy Larrabee:
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs. ITC 1991: 492-499

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