"The Implementation of Pseudo-Random Memory Tests on Commercial Memory Testers."

Ad J. van de Goor, Mike Lin (1997)

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DOI: 10.1109/TEST.1997.639618

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ad J. van de Goor, Mike Lin:
The Implementation of Pseudo-Random Memory Tests on Commercial Memory Testers. ITC 1997: 226-235

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