"Robustly Scan-Testable CMOS Sequential Circuits."

Bong-Hee Park, Premachandran R. Menon (1991)

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DOI: 10.1109/TEST.1991.519518

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Bong-Hee Park, Premachandran R. Menon:
Robustly Scan-Testable CMOS Sequential Circuits. ITC 1991: 263-272

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