"A Mixed Functional/IDDQ Testing Methodology for CMOS Transistor Faults."

Evstratios Vandris, Gerald E. Sobelman (1991)

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DOI: 10.1109/TEST.1991.519724

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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Evstratios Vandris, Gerald E. Sobelman:
A Mixed Functional/IDDQ Testing Methodology for CMOS Transistor Faults. ITC 1991: 608-614

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