"Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and ..."

Walid Amir, Dae-Hyun Kim, Tae-Woo Kim (2020)

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DOI: 10.1109/ACCESS.2020.3038856

access: open

type: Journal Article

metadata version: 2020-12-17

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Walid Amir, Dae-Hyun Kim, Tae-Woo Kim:
Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al₂O₃/In_0.53Ga_0.47As on a 300-mm Si Substrate. IEEE Access 8: 211464-211473 (2020)

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