"Delay Characterization and Testing of Arbitrary Multiple-Pin Interconnects."

Shi-Yu Huang et al. (2016)

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DOI: 10.1109/MDAT.2015.2455331

access: closed

type: Journal Article

metadata version: 2020-03-13

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Shi-Yu Huang, Meng-Ting Tsai, Kun-Han Tsai, Wu-Tung Cheng:
Delay Characterization and Testing of Arbitrary Multiple-Pin Interconnects. IEEE Des. Test 33(2): 9-16 (2016)

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