"Robust SRAM Design via BIST-Assisted Timing-Tracking (BATT)."

Ya-Chun Lai, Shi-Yu Huang (2009)

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DOI: 10.1109/JSSC.2008.2011042

access: closed

type: Journal Article

metadata version: 2020-08-30

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Ya-Chun Lai, Shi-Yu Huang:
Robust SRAM Design via BIST-Assisted Timing-Tracking (BATT). IEEE J. Solid State Circuits 44(2): 642-649 (2009)

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