"Reliability issues of GaN based high voltage power devices."

Joachim Würfl et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.017

access: closed

type: Journal Article

metadata version: 2021-10-14

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Joachim Würfl, Eldad Bahat-Treidel, Frank Brunner, E. Cho, Oliver Hilt, Ponky Ivo, A. Knauer, Paul Kurpas, Richard Lossy, Matthias Schulz, S. Singwald, Markus Weyers, Rimma Zhytnytska:
Reliability issues of GaN based high voltage power devices. Microelectron. Reliab. 51(9-11): 1710-1716 (2011)

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