"Are concurrency coverage metrics effective for testing: a comprehensive ..."

Shin Hong et al. (2015)

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DOI: 10.1002/STVR.1539

access: closed

type: Journal Article

metadata version: 2020-04-01

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Shin Hong, Matt Staats, Jaemin Ahn, Moonzoo Kim, Gregg Rothermel:
Are concurrency coverage metrics effective for testing: a comprehensive empirical investigation. Softw. Test. Verification Reliab. 25(4): 334-370 (2015)

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