"Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann ..."

Mikail Yayla et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TCSI.2022.3156165

access: open

type: Journal Article

metadata version: 2023-08-28

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/tcasI/YaylaTBMCA22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcasI/YaylaTBMCA22
Mikail Yayla, Simon Thomann, Sebastian Buschjäger, Katharina Morik, Jian-Jia Chen, Hussam Amrouch:
Reliable Binarized Neural Networks on Unreliable Beyond Von-Neumann Architecture. IEEE Trans. Circuits Syst. I Regul. Pap. 69(6): 2516-2528 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.