Paper 2020/988
120.147 Efficient Electromagnetic Side Channel Analysis by Probe Positioning using Multi-Layer Perceptron
Anupam Golder, Baogeng Ma, Debayan Das, Josef Danial, Shreyas Sen, and Arijit Raychowdhury
Abstract
In this work, we investigate a practical consideration for Electromagnetic (EM) side-channel analysis, namely, positioning EM probe at the best location for an efficient attack, requiring fewer traces to reveal the secret key of cryptographic engines. We present Multi-Layer Perceptron (MLP) based probe positioning and EM analysis method, defining it as a classification problem by dividing the chip surface scanned by the EM probe into virtual grids, and identifying each grid location by a class label. The MLP, trained to identify the location given a single EM trace, achieves $99.55\%$ accuracy on average for traces captured during different acquisition campaigns.
Note: This work has been presented as a poster at 57th Design Automation Conference, July 20-24, 2020. (http://www2.dac.com/events/eventdetails.aspx?id=295-120). This is the full paper version of the poster.
Metadata
- Available format(s)
-
PDF
- Category
- Applications
- Publication info
- Published elsewhere. 57th DAC Work-In-Progress Session, 2020
- Keywords
- EM Probe PositioningSide-Channel AnalysisMulti-Layer PerceptronCorrelation Analysis
- Contact author(s)
- anupamgolder @ gatech edu
- History
- 2020-08-18: received
- Short URL
- https://ia.cr/2020/988
- License
-
CC BY
BibTeX
@misc{cryptoeprint:2020/988,
author = {Anupam Golder and Baogeng Ma and Debayan Das and Josef Danial and Shreyas Sen and Arijit Raychowdhury},
title = {120.147 Efficient Electromagnetic Side Channel Analysis by Probe Positioning using Multi-Layer Perceptron},
howpublished = {Cryptology {ePrint} Archive, Paper 2020/988},
year = {2020},
url = {https://eprint.iacr.org/2020/988}
}
