A thin-layer model for viscoelastic, stress-relaxation testing of cells using atomic force microscopy: do cell properties reflect metastatic potential? (Q35632931)
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scientific article published on 8 December 2006
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | A thin-layer model for viscoelastic, stress-relaxation testing of cells using atomic force microscopy: do cell properties reflect metastatic potential? |
scientific article published on 8 December 2006 |
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A thin-layer model for viscoelastic, stress-relaxation testing of cells using atomic force microscopy: do cell properties reflect metastatic potential? (English)
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Eric M Darling
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Stefan Zauscher
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Joel A Block
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Farshid Guilak
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8 December 2006
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92
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5
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1784-1791
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