http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114424322-A

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classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02P80-30
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-306
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filingDate 2020-09-24^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dd182f9b1a7484f080388bd8b65d3b69
publicationDate 2022-04-29^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-114424322-A
titleOfInvention Manufacturing method of SiC substrate
abstract The technical problem to be solved by the present invention is to provide a new technology for manufacturing a SiC substrate which can reduce the material loss when removing the strained layer. The present invention is a method of manufacturing a SiC substrate (30), comprising: a strained layer thinning step (S1) of making the strained layer (12) of the SiC substrate body (10) move to the surface side (12) THINKS. In this way, by including the strained layer thinning step (S1) for moving (concentrating) the strained layer (12) to the surface side, the material loss (L) when removing the strained layer (12) can be reduced.
priorityDate 2019-09-27^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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