http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015146279-A

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filingDate 2014-02-04^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_008e05a33536838793e058823d1efa3b
publicationDate 2015-08-13^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2015146279-A
titleOfInvention Plasma processing apparatus and method
abstract An object of the present invention is to provide a plasma processing apparatus and method capable of efficiently generating a long thermal plasma with excellent uniformity and suppressing electrostatic damage. A substrate 1 on which a thin film 2 is formed is disposed opposite to an inductively coupled plasma torch unit T. The coil 3 is disposed in the vicinity of the first ceramic block 4 and the second ceramic block 5. Since the high-frequency electromagnetic field generated by the coil 3 is effectively shielded by the shield plate 13, the high-frequency electromagnetic field in the vicinity of the substrate 1 is considerably weakened, so that electrostatic damage hardly occurs. [Selection] Figure 1
priorityDate 2014-02-04^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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