http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101303178-B1

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-108
filingDate 2007-08-30^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2013-09-09^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2013-09-09^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101303178-B1
titleOfInvention Capacitor dielectric film manufacturing method
abstract Disclosed is a method of manufacturing a dielectric film of a capacitor having excellent electrical characteristics and leakage current characteristics without lowering throughput. The disclosed invention is a method of manufacturing a dielectric film by repeating a unit cycle consisting of supplying a first reaction source, purging, supplying a second reaction source, and purging a plurality of times. At least one of the first reaction source and the second reaction source is supplied for a first time during an initial cycle of the plurality of cycles, and a first reaction source and a second during the later cycles from the initial cycle to the final cycle. The reaction source is fed for a second time shorter than the first time. At this time, the number of initial cycles is smaller than the number of late cycles.n n n n Cycle, ALD, Reaction Source, Hafnium Oxide, Aluminum Oxide
priorityDate 2006-10-10^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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