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filingDate 2018-08-28^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-04-23^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_40700f1b64c7f37899a2dfb3da0d804b
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publicationDate 2019-04-23^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10269811-B2
titleOfInvention Selective SAC capping on fin field effect transistor structures and related methods
abstract FinFET structures and methods of forming such structures. The FinFET structures including a substrate; at least two gates disposed on the substrate; a plurality of source/drain regions within the substrate adjacent to each of the gates; a dielectric disposed between each gate and the plurality of source/drain regions adjacent to each gate; a dielectric capping layer disposed on a first one of the at least two gates, wherein no dielectric capping layer is disposed on a second one of the at least two gates; and a local interconnect electrically connected to the second one of the at least two gates, wherein the dielectric capping layer disposed on the first one of the at least two gates prevents an electrical connection between the local interconnect and the first one of the at least two gates.
priorityDate 2016-09-08^^<http://www.w3.org/2001/XMLSchema#date>
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