http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6552431-B2

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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28518
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76856
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76843
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76855
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-285
filingDate 2001-03-06^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2003-04-22^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6f20f5a8faea7f1e0164d2aedf5180a8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6ce662a9866a71c8a21e2a6963ae802f
publicationDate 2003-04-22^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-6552431-B2
titleOfInvention Semiconductor structure with a titanium aluminum nitride layer and method for fabricating same
abstract A semiconductor device having a contact layer and a diffusion barrier layer is fabricated by preparing a semiconductor substrate, forming a layer of titanium/aluminum alloy on the surface of the substrate, and then heating the resultant structure in a nitrogen ambient to form a contact layer of titanium silicide interposed between the substrate and a diffusion barrier layer consisting of titanium/aluminum/nitride.
priorityDate 1996-05-08^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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