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filingDate 2015-03-10^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2016-08-09^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-9410901-B2
titleOfInvention Image sensor, an inspection system and a method of inspecting an article
abstract A high sensitivity image sensor comprises an epitaxial layer of silicon that is intrinsic or lightly p doped (such as a doping level less than about 10 13 cm −3 ). CMOS or CCD circuits are fabricated on the front-side of the epitaxial layer. Epitaxial p and n type layers are grown on the backside of the epitaxial layer. A pure boron layer is deposited on the n-type epitaxial layer. Some boron is driven a few nm into the n-type epitaxial layer from the backside during the boron deposition process. An anti-reflection coating may be applied to the pure boron layer. During operation of the sensor a negative bias voltage of several tens to a few hundred volts is applied to the boron layer to accelerate photo-electrons away from the backside surface and create additional electrons by an avalanche effect. Grounded p-wells protect active circuits as needed from the reversed biased epitaxial layer.
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