"Adaptive testing of analog/RF circuits using hardware extracted FSM models."

Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee (2016)

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DOI: 10.1109/VTS.2016.7477283

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/DeyatiMC16
Sabyasachi Deyati, Barry John Muldrey, Abhijit Chatterjee:
Adaptive testing of analog/RF circuits using hardware extracted FSM models. VTS 2016: 1-6

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