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ORCIDVictor M. van Santen
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2020 – today
- 2024
[j13]Tarek Mohamed
, Victor M. van Santen, Lilas Alrahis, Ozgur Sinanoglu, Hussam Amrouch:
Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Trans. Circuits Syst. I Regul. Pap. 71(7): 3269-3281 (2024)- [c20]Hussam Amrouch, Victor M. van Santen, Javier Diaz-Fortuny, Florian Klemme:
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper). IRPS 2024: 1-8 - [c19]Benjamin Hien, Marcel Walter, Victor M. van Santen, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch, Robert Wille:
Technology Mapping for Cryogenic CMOS Circuits. ISVLSI 2024: 272-277 - 2023
- [b1]Victor M. van Santen:
Degradation Models and Optimizations for CMOS Circuits. Karlsruhe University, Germany, 2023 - [j12]Victor M. van Santen, Fu Lam Florian Diep, Jörg Henkel, Hussam Amrouch:
Massively Parallel Circuit Setup in GPU-SPICE. IEEE Trans. Computers 72(8): 2127-2138 (2023) - [j11]Shivendra Singh Parihar, Victor M. van Santen, Simon Thomann, Girish Pahwa, Yogesh Singh Chauhan, Hussam Amrouch:
Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K. IEEE Trans. Circuits Syst. I Regul. Pap. 70(8): 3089-3102 (2023) - [j10]Divya Praneetha Ravipati, Victor M. van Santen, Sami Salamin, Hussam Amrouch, Preeti Ranjan Panda:
Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT. IEEE Trans. Very Large Scale Integr. Syst. 31(9): 1280-1293 (2023) - [c18]Victor M. van Santen, Marcel Walter, Florian Klemme, Shivendra Singh Parihar, Girish Pahwa, Yogesh Singh Chauhan, Robert Wille, Hussam Amrouch:
Design Automation for Cryogenic CMOS Circuits. DAC 2023: 1-6 - [c17]Victor M. van Santen, Florian Klemme, Paul R. Genssler, Hussam Amrouch:
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits. DFT 2023: 1-6 - [c16]Victor M. van Santen, Jose M. Gata-Romero, Juan Núñez, Rafael Castro-López, Elisenda Roca, Hussam Amrouch:
Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths. IRPS 2023: 1-6 - 2022
- [j9]Paul R. Genssler, Victor M. van Santen, Jörg Henkel, Hussam Amrouch:
On the Reliability of FeFET On-Chip Memory. IEEE Trans. Computers 71(4): 947-958 (2022) - [j8]Divya Praneetha Ravipati, Rajesh Kedia, Victor M. van Santen, Jörg Henkel, Preeti Ranjan Panda, Hussam Amrouch:
FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies. IEEE Trans. Very Large Scale Integr. Syst. 30(3): 339-352 (2022) - 2021
- [j7]Sami Salamin, Victor M. van Santen, Martin Rapp, Jörg Henkel, Hussam Amrouch:
Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient. IEEE Access 9: 30687-30697 (2021) - [c15]Victor M. van Santen, Linda Schillinger, Hussam Amrouch:
Self-Heating Effects from Transistors to Gates. VLSI-DAT 2021: 1-4 - [c14]Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan:
Special Session: Machine Learning for Semiconductor Test and Reliability. VTS 2021: 1-11 - [c13]Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch:
Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks. VTS 2021: 1-7 - 2020
- [j6]Victor M. van Santen, Hussam Amrouch, Pooja Kumari, Jörg Henkel:
On the Workload Dependence of Self-Heating in FinFET Circuits. IEEE Trans. Circuits Syst. II Express Briefs 67-II(10): 1949-1953 (2020) - [c12]Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel, Hussam Amrouch:
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology. ASP-DAC 2020: 68-73 - [c11]Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Singh Chauhan, Jörg Henkel:
NCFET to Rescue Technology Scaling: Opportunities and Challenges. ASP-DAC 2020: 637-644 - [c10]Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch:
Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities. ICCAD 2020: 15:1-15:9 - [c9]Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch:
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. IRPS 2020: 1-7
2010 – 2019
- 2019
- [j5]Victor M. van Santen, Hussam Amrouch, Jörg Henkel:
Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(7): 2671-2684 (2019) - [j4]Victor M. van Santen, Hussam Amrouch, Jörg Henkel:
Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Trans. Circuits Syst. II Express Briefs 66-II(9): 1527-1531 (2019) - [j3]Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel:
Modeling the Interdependences Between Voltage Fluctuation and BTI Aging. IEEE Trans. Very Large Scale Integr. Syst. 27(7): 1652-1665 (2019) - [c8]Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, Jörg Henkel:
Reliability Challenges with Self-Heating and Aging in FinFET Technology. IOLTS 2019: 68-71 - 2018
- [j2]Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel:
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(1): 293-306 (2018) - [c7]Hussam Amrouch, Victor M. van Santen, Jörg Henkel:
Estimating and optimizing BTI aging effects: from physics to CAD. ICCAD 2018: 125 - [c6]Victor M. van Santen, Hussam Amrouch, Jörg Henkel:
Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE. IOLTS 2018: 143-146 - [c5]Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Jörg Henkel, Montserrat Nafría:
Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability. IRPS 2018: 6-1 - 2017
- [j1]Hussam Amrouch, Victor M. van Santen, Jörg Henkel:
Interdependencies of Degradation Effects and Their Impact on Computing. IEEE Des. Test 34(3): 59-67 (2017) - 2016
- [c4]Victor M. van Santen, Hussam Amrouch, Javier Martín-Martínez, Montserrat Nafría, Jörg Henkel:
Designing guardbands for instantaneous aging effects. DAC 2016: 69:1-69:6 - [c3]Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel:
Aging-aware voltage scaling. DATE 2016: 576-581 - 2015
- [c2]Hussam Amrouch, Javier Martín-Martínez, Victor M. van Santen, Miquel Moras, Rosana Rodríguez, Montserrat Nafría, Jörg Henkel:
Connecting the physical and application level towards grasping aging effects. IRPS 2015: 3 - 2014
- [c1]Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel:
Towards interdependencies of aging mechanisms. ICCAD 2014: 478-485
Coauthor Index
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