A Novel Method for Control Performance Assessment with Fractional Order Signal Processing and Its Application to Semiconductor Manufacturing
Abstract
:1. Introduction
- Use MFDFA to analyze semiconductor data, derive the multifractal spectrum and select the characteristic parameters sensitive to changes of the control system.
- Extract the characteristic parameters from the multifractal spectrum of reference data to form reference feature sets;
- Modify the standard single Hurst exponent estimation by the multiple Hurst exponent fitting method with crossover points;
- Select multifractal properties and modified Hurst exponents to distinguish different types of control actions (tunings).
2. Preliminaries
2.1. Fractal and Fractional Gaussian Noise
2.2. Hurst Parameter
2.3. Stable Distribution
3. MFDFA Algorithm
3.1. Basic MFDFA Algorithm
- Define the “profile” E and transform original data into mean-reduced cumulative sums,
- Divide time series into non-overlapping segments of equal length s, starting from the beginning. Since the length N of the series is often not a multiple of the considered time scale s, in order to not miss any piece of data, another set of segments starting from the end of data is made from the end coming to the beginning. As a result, segments are obtained covering the whole dataset.
- Calculate the local trend for each of the segments by a least-square fit of the series.
- Calculate the mean square error for the estimate of each segment k of length s.
- Average over all segments to obtain the qth order variance (or fluctuation) function for each size s:For use
- Repeat steps (2)–(5) for different s evaluating new sets of variances .
- Plot for each q in log-log scale and estimate the linear fit with least squares. If slope varies with q, multifractality is suspected. Single slope shows monofractal scaling.
- Calculate multifractal exponent as
- Use Legendre transform to evaluate Hölder exponent and multifractal spectrum :
3.2. Defining the Source of the Multifractality
3.3. Plot Fitting Hurst Exponents with Crossovers
4. Case Studies
4.1. Non-Gaussian Statistical Analysis
4.2. Hurst Exponents Fitting with Crossovers
4.3. Multifractal Analysis
5. Results and Discussion
6. Conclusions
Author Contributions
Funding
Conflicts of Interest
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Variables | |||||||
---|---|---|---|---|---|---|---|
Var1 | 1.241 | 0.074 | 0.411 | 0.101 | 1.07 | 0.21 | 0.881 |
Var2 | 1.634 | 0.056 | 0.025 | −0.030 | 0.82 | 0.06 | 0.757 |
Var3 | 2.000 | −1.000 | 0.456 | −0.235 | 0.58 | 0.46 | 0.127 |
Var1’ | 1.171 | −0.156 | 0.456 | −0.235 | 1.04 | 0.25 | 0.798 |
Var2’ | 1.695 | 0.287 | 0.123 | −0.246 | 0.71 | 0.41 | 0.307 |
Var3’ | 2.000 | 1.000 | 1.567 | −0.208 | 0.57 | 0.53 | 0.069 |
Variables | |||
---|---|---|---|
Var1 | 0.682 | 0.913, 0.450 | 0.991, 0.671, 0.392 |
Var2 | 0.714 | 0.926, 0.500 | 0.964, 0.728, 0.436 |
Var3 | 1.010 | 1.044, 0.974 | 1.041, 1.035, 0.930 |
Var1’ | 0.622 | 0.827, 0.416 | 0.905, 0.560, 0.415 |
Var2’ | 0.824 | 1.099, 0.546 | 1.062, 0.951, 0.350 |
Var3’ | 0.968 | 1.057, 0.878 | 1.006, 1.066, 0.751 |
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Liu, K.; Chen, Y.; Domański, P.D.; Zhang, X. A Novel Method for Control Performance Assessment with Fractional Order Signal Processing and Its Application to Semiconductor Manufacturing. Algorithms 2018, 11, 90. https://doi.org/10.3390/a11070090
Liu K, Chen Y, Domański PD, Zhang X. A Novel Method for Control Performance Assessment with Fractional Order Signal Processing and Its Application to Semiconductor Manufacturing. Algorithms. 2018; 11(7):90. https://doi.org/10.3390/a11070090
Chicago/Turabian StyleLiu, Kai, YangQuan Chen, Paweł D. Domański, and Xi Zhang. 2018. "A Novel Method for Control Performance Assessment with Fractional Order Signal Processing and Its Application to Semiconductor Manufacturing" Algorithms 11, no. 7: 90. https://doi.org/10.3390/a11070090